Measuring apparatus, test apparatus, recording medium, program and electronic device

ABSTRACT

There is provided a measuring apparatus for measuring a signal-to-noise ratio of a discrete waveform which is output from an AD converter in response to an input signal, where the signal-to-noise ratio indicates a ratio of a signal component of the input signal to noise generated by the AD converter. The measuring apparatus includes a spectrum compensating section that receives a spectrum of the discrete waveform output from the AD converter, and compensates the received spectrum in accordance with a non-symmetric sideband between an upper sideband and a lower sideband of the received spectrum, where the upper and lower sidebands are defined with respect to a fundamental frequency of the input signal, and a phase noise waveform calculating section that calculates a phase noise waveform of the discrete waveform based on the spectrum which has been compensated by the spectrum compensating section.

BACKGROUND

1. Technical Field

The present invention relates to a measuring apparatus, a testapparatus, a recording medium, a program and an electronic device. Moreparticularly, the present invention relates to a measuring apparatus formeasuring jitter of a signal under measurement, and to a measuringapparatus for measuring jitter generated by an AD converter.

2. Related Art

One of the methods to measure jitter generated by an AD converter is toinput an input signal and a sampling clock into the AD converter andmeasure jitter included in the output from the AD converter. Here, theinput signal is a sine wave with small jitter, for example, and thesampling clock also has small jitter. The jitter generated by the ADconverter represents, for example, the variance in the aperture delayfrom the zero cross timing of the sampling clock at which a startconversion command is given to the moment at which the level of theinput signal is held. This jitter is also referred to as aperturejitter.

The aperture jitter indicates the random variation in the time requiredto hold an analog input. Accordingly, the aperture jitter is consideredto be one type of instantaneous phase noise.

The sampling clock supplied to a high-resolution AD converter has verysmall jitter, that is to say, phase noise. For example, the jitter is−140 dBc/Hz when the offset frequency is equal to 100 kHz. Thisnecessitates expensive special measuring equipment for the measurement.Therefore, there is a demand for a method and an apparatus which canaccurately measure the sampling clock with very small jitter at a lowcost.

The jitter contained in the output from the AD converter may be measuredbased on the spectrum obtained by performing Fourier transform on theoutput discrete waveform from the AD converter. For example, the rootmean square (RMS) value of the jitter and the signal to noise ratio,SNR, are estimated based on the energy of the noise component containedin the spectrum.

The SNR is defined as the ratio of signal power to noise power. Thesignal power and the noise power are measured with respect to theobservable positive frequencies. The noise that may be generated by theAD converter 400 includes quantization noise, aperture jitter andthermal noise. Such varieties of noise degrade the SNR.

The SNR due to the quantization noise and the aperture jitter, and thesampling clock jitter, generated by the AD converter is represented bythe following equation.

$\begin{matrix}{{SNR} = {10\log_{10}{\left\{ \frac{\left( \frac{V_{FS}}{2} \right)^{2}}{\frac{\Delta^{2}}{12} + {\left( \frac{V_{FS}}{2} \right)^{2}\left( {2\pi \; f_{i\; n}} \right)^{2}\sigma_{\Delta\varphi}^{2}}} \right\} \lbrack{dB}\rbrack}}} & {{Equation}\mspace{14mu} 1}\end{matrix}$

Here, V_(FS)/2 denotes the amplitude of the analog sine wave input intothe AD converter, f_(in) denotes the frequency of the sine wave, Δdenotes the quantization step of the AD converter, and σ_(Δφ) denotesthe aperture jitter.

As seen from the equation 1, when the sine wave input into the ADconverter has a sufficiently low frequency, the SNR_(Q) is dominated bythe quantization noise. In other words, the equation 1 becomes thefollowing equation indicating a constant value.

$\begin{matrix}\begin{matrix}{\left. {SNR}\rightarrow{SNR}_{Q} \right. = {10\log_{10}\left\{ \frac{\left( \frac{V_{FS}}{2} \right)^{2}}{\frac{\Delta^{2}}{12}} \right\}}} \\{= {{6.02B_{e}} + {1.76\;\lbrack{dB}\rbrack}}}\end{matrix} & {{Equation}\mspace{14mu} 2}\end{matrix}$

On the other hand, when the frequency f_(in) is sufficiently high andthe quantization step is sufficiently small, the SNR_(T) is dominated bythe aperture jitter. Accordingly, the equation 1 becomes the followingequation. The SNR_(T) linearly changes with respect to the logarithmicfrequency log₁₀f_(in).

$\left. {SNR}\rightarrow{SNR}_{T} \right. = {10\log_{10}{\frac{1}{\left( {2\pi \; f_{i\; n}\sigma_{\Delta\varphi}} \right)^{2}}\lbrack{dB}\rbrack}}$

Which is to say,

SNR _(T)∝−20 log₁₀ f _(in)−20 log₁₀ σ_(Δφ)  Equation 3

FIG. 28A illustrates, as an example, the relation between the effectivenumber of bits ENOB of the AD converter and the frequency of the analoginput which is applied into the AD converter. As stated earlier, theENOB_(Q) remains at a substantially constant value in the region wherethe analog input has a low frequency, that is to say, f_(in)<100 MHz. Onthe other hand, the ENOB_(T) changes linearly in the region where theanalog input has a high frequency, that is to say, f_(in)>100 MHz. Tocalculate the linear change, it is necessary to measure the ENOB at, atleast, two frequencies in the region where the analog input has a highfrequency.

FIG. 28B illustrates, as an example, the spectra obtained by performingthe Fourier transform on the outputs from the AD converter. FIG. 28Bshows the spectrum of the discrete waveform data output from the ADconverter when a low-frequency input signal is applied to the ADconverter, as shown in the left graph in FIG. 28B, and the spectrum ofthe discrete waveform data output from the AD converter when ahigh-frequency input signal is applied to the AD converter, as shown inthe right graph in FIG. 28B.

Each of the spectra shown in FIG. 28B contains a signal componentcorresponding to the frequency of the input signal, for example, thecomponent of the line spectrum in FIG. 28B, and a noise componentgenerated by the AD converter, for example, the remaining components inFIG. 28B. Here, the noise component contains therein quantization noisecomponent that is independent from the frequency of the input signal anda jitter component that is dependent on the frequency of the inputsignal. Therefore, it is assumed that the energy of the jitter componentthat is dependent on the frequency of the input signal can be obtainedby calculating the difference Δ in the energy, that is to say, the sumof the signal component and the noise component, between the spectra, asillustrated in FIG. 28B. This assumption, however, has not beenverified.

The ENOB of the AD converter with respect to the amplitude axis can beobtained by calculation based on the quantization noise component. Whichis to say, the ENOB can be calculated based on the SNR of the spectrumof the discrete waveform data output from the AD converter when an inputsignal having a given frequency is input into the AD converter. However,no methods and apparatuses have been known which can measure the ENOBdue only to the jitter component.

In order to estimate the jitter by measuring the difference between thespectra as described above, it is required to measure spectra twice.Also, it is not possible to measure the ENOB or SNR for which theaperture jitter is dominant, i.e. the ENOB_(T) or SNR_(T) in the rightregion in FIG. 28A, by using the analog input having the low frequencyas shown in the left region in FIG. 28A

The two spectra illustrated in FIG. 28B are observed at differenttimings, that is to say, not measured at the same time. Therefore, it isdifficult to accurately isolate the jitter component contained in thenoise component from the quantization noise component in the noisecomponent. Additionally, since the above method calculates the jitterbased on the energies of the noise components contained in the spectra,the above method can only calculate the RMS value of the jitter, butcannot calculate the change in the instantaneous value of the jittersuch as the peak value and the peak-to-peak value, and the aperturejitter waveform. Therefore, it is difficult to provide feedback data tothe design of the AD converter.

FIG. 29 illustrates a different method to measure the jitter based onthe spectrum obtained by performing the Fourier transform on the outputfrom the AD converter. This method extracts, from the spectrum,frequency components within a frequency range which is substantiallysymmetrical with respect to the fundamental frequency of the inputsignal and contains no harmonic components, and performs the inverseFourier transform on the extracted frequency components. In this way,the method generates an analytic signal for the output waveform from theAD converter.

It is important to set, to zero, all of the harmonic components, whichare strongly correlated to the signal, in order to measure the randomvariation in both the amplitude and the timing in the frequency domain.When the harmonic components are all set to zero, the spectrum is leftwith the line spectrum of the fundamental and the random noise.

Here, the instantaneous phase of the output waveform from the ADconverter is obtained by the arctangent of the real and imaginary partsof the analytic signal, and the obtained instantaneous phase can be usedto obtain the jitter. This method is disclosed in U.S. Pat. No.6,525,523, for example.

Obtaining the instantaneous phase of the output waveform, this methodcan calculate the peak value, the peak-to-peak value and the like of thejitter. Note that performing the Fourier transform on the discretewaveform output from the AD converter produces the spectrum containingthe harmonic components as illustrated in the left graph in FIG. 28B.Because of the aliasing effects, the line spectra of the harmoniccomponents are present in the vicinity of the line spectrum of thefundamental. For this reason, when the frequency components that containno harmonic components are extracted by using a filter in accordancewith the method illustrated in FIG. 29, the observable frequency rangeis narrow and broadband jitter can not be measured.

As explained in the above, the method illustrated in FIG. 29 can notmeasure the noise component corresponding to the frequency which is farfrom the fundamental frequency of the input signal. To summarize, thereis a demand for a method which can measure the peak value, thepeak-to-peak value and the like of the jitter, and can measure jitter ina broad bandwidth. Here, since the conversion rate of the AD converteris expected to further increase, it is preferable to provide a methodand an apparatus which can measure the intrinsic jitter component of theAD converter or the ENOB corresponding only to the jitter component ofthe sampling clock.

SUMMARY

Therefore, it is an object of an aspect of the innovations herein toprovide a measuring apparatus, a test apparatus, a recording medium, aprogram and an electronic device, which are capable of overcoming theabove drawbacks accompanying the related art. The above and otherobjects can be achieved by combinations described in the independentclaims. The dependent claims define further advantageous and exemplarycombinations of the innovations herein.

According to the first aspect related to the innovations herein, oneexemplary measuring apparatus may include a measuring apparatus formeasuring a signal-to-noise ratio of a discrete waveform which is outputfrom an AD converter in response to an input signal, where thesignal-to-noise ratio indicates a ratio of a signal component of theinput signal to noise generated by the AD converter. The measuringapparatus includes a spectrum compensating section that receives aspectrum of the discrete waveform output from the AD converter, andcompensates the received spectrum in accordance with a non-symmetricsideband between an upper sideband and a lower sideband of the receivedspectrum, where the upper and lower sidebands are defined with respectto a fundamental frequency of the input signal, and a phase noisewaveform calculating section that calculates a phase noise waveform ofthe discrete waveform based on the spectrum which has been compensatedby the spectrum compensating section.

According to the second aspect related to the innovations herein, oneexemplary test apparatus may include a test apparatus for testing an ADconverter, including a measuring apparatus that measures one of (i) asignal-to-noise ratio of a discrete waveform which is output from the ADconverter in response to an input signal and (ii) an effective number ofbits of the AD converter, and a judging section that judges whether theAD converter is acceptable based on a result of the measurement by themeasuring apparatus. The measuring apparatus includes a spectrumcompensating section that receives a spectrum of the discrete waveformoutput from the AD converter, and compensates the received spectrum inaccordance with a non-symmetric sideband between an upper sideband and alower sideband of the received spectrum, where the upper and lowersidebands are defined with respect to a fundamental frequency of theinput signal, and a phase noise waveform calculating section thatcalculates a phase noise waveform of the discrete waveform based on thespectrum which has been compensated by the spectrum compensatingsection.

According to the third aspect related to the innovations herein, oneexemplary recording medium may include a recording medium storingthereon a program that causes a computer to function as a measuringapparatus that measures a signal-to-noise ratio of a discrete waveformwhich is output from an AD converter in response to an input signal,where the signal-to-noise ratio indicates a ratio of a signal componentof the input signal to noise generated by the AD converter. The programcauses the computer to function as a spectrum compensating section thatreceives a spectrum of the discrete waveform output from the ADconverter, and compensates the received spectrum in accordance with anon-symmetric sideband between an upper sideband and a lower sideband ofthe received spectrum, where the upper and lower sidebands are definedwith respect to a fundamental frequency of the input signal, and a phasenoise waveform calculating section that calculates a phase noisewaveform of the discrete waveform based on the spectrum which has beencompensated by the spectrum compensating section.

According to the fourth aspect related to the innovations herein, oneexemplary program may include a program causing a computer to functionas a measuring apparatus that measures a signal-to-noise ratio of adiscrete waveform which is output from an AD converter in response to aninput signal, where the signal-to-noise ratio indicates a ratio of asignal component of the input signal to noise generated by the ADconverter. The program causes the computer to function as a spectrumcompensating section that receives a spectrum of the discrete waveformoutput from the AD converter, and compensates the received spectrum inaccordance with a non-symmetric sideband between an upper sideband and alower sideband of the received spectrum, where the upper and lowersidebands are defined with respect to a fundamental frequency of theinput signal, and a phase noise waveform calculating section thatcalculates a phase noise waveform of the discrete waveform based on thespectrum which has been compensated by the spectrum compensatingsection.

According to the fifth aspect related to the innovations herein, oneexemplary measuring apparatus may include a measuring apparatus formeasuring a signal-to-noise ratio of a discrete waveform which is outputfrom an AD converter in response to an input signal, where thesignal-to-noise ratio indicates a ratio of a signal component of theinput signal to noise generated by the AD converter. The measuringapparatus includes a single sideband spectrum generating section thatreceives a spectrum of the discrete waveform output from the ADconverter, and generates a single sideband spectrum whose sideband isone of an upper sideband and a lower sideband of the received spectrum,where the upper sideband is higher in frequency than a fundamentalfrequency of the input signal and the lower sideband is lower infrequency than the fundamental frequency of the input signal, and aphase noise waveform calculating section that calculates a phase noisewaveform of the discrete waveform based on the single sideband spectrum.

According to the sixth aspect related to the innovations herein, oneexemplary test apparatus may include a test apparatus for testing an ADconverter, including a measuring apparatus that measures one of (i) asignal-to-noise ratio of a discrete waveform which is output from the ADconverter in response to an input signal and (ii) an effective number ofbits of the AD converter, and a judging section that judges whether theAD converter is acceptable based on a result of the measurement by themeasuring apparatus. The measuring apparatus includes a single sidebandspectrum generating section that receives a spectrum of the discretewaveform output from the AD converter, and generates a single sidebandspectrum whose sideband is one of an upper sideband and a lower sidebandof the received spectrum, where the upper sideband is higher infrequency than a fundamental frequency of the input signal and the lowersideband is lower in frequency than the fundamental frequency of theinput signal, and a phase noise waveform calculating section thatcalculates a phase noise waveform of the discrete waveform based on thesingle sideband spectrum.

According to the seventh aspect related to the innovations herein, oneexemplary recording medium may include a recording medium storingthereon a program that causes a computer to function as a measuringapparatus that measures a signal-to-noise ratio of a discrete waveformwhich is output from an AD converter in response to an input signal,where the signal-to-noise ratio indicates a ratio of a signal componentof the input signal to noise generated by the AD converter. The programcauses the computer to function as a single sideband spectrum generatingsection that receives a spectrum of the discrete waveform output fromthe AD converter, and generates a single sideband spectrum whosesideband is one of an upper sideband and a lower sideband of thereceived spectrum, where the upper sideband is higher in frequency thana fundamental frequency of the input signal and the lower sideband islower in frequency than the fundamental frequency of the input signal,and a phase noise waveform calculating section that calculates a phasenoise waveform of the discrete waveform based on the single sidebandspectrum.

According to the eighth aspect related to the innovations herein, oneexemplary program may include a program causing a computer to functionas a measuring apparatus that measures a signal-to-noise ratio of adiscrete waveform which is output from an AD converter in response to aninput signal, where the signal-to-noise ratio indicates a ratio of asignal component of the input signal to noise generated by the ADconverter. The program causes the computer to function as a singlesideband spectrum generating section that receives a spectrum of thediscrete waveform output from the AD converter, and generates a singlesideband spectrum whose sideband is one of an upper sideband and a lowersideband of the received spectrum, where the upper sideband is higher infrequency than a fundamental frequency of the input signal and the lowersideband is lower in frequency than the fundamental frequency of theinput signal, and a phase noise waveform calculating section thatcalculates a phase noise waveform of the discrete waveform based on thesingle sideband spectrum.

According to the ninth aspect related to the innovations herein, oneexemplary measuring apparatus may include a measuring apparatus formeasuring jitter of a clock signal under measurement. The measuringapparatus includes a signal measuring section that measures a waveformof an input signal with a predetermined sampling frequency, a frequencydomain transforming section that transforms the waveform measured by thesignal measuring section into a spectrum of a predetermined frequencyrange, a spectrum compensating section that detects a non-symmetricsideband in the predetermined frequency range between a sideband that ishigher in frequency than a fundamental frequency of the input signal anda sideband that is lower in frequency than the fundamental frequency ofthe input signal, and compensates the spectrum obtained by the frequencydomain transforming section in accordance with frequency components inthe detected non-symmetric sideband, and a jitter measuring section thatmeasures the jitter of the clock signal under measurement based on thespectrum which has been compensated by the spectrum compensatingsection.

According to the tenth aspect related to the innovations herein, oneexemplary test apparatus may include a test apparatus for testing adevice under test. The test apparatus includes a measuring apparatusthat measures jitter of a clock signal under measurement output from thedevice under test, and a judging section that judges whether the deviceunder test is acceptable based on the jitter measured by the measuringapparatus. The measuring apparatus includes a signal measuring sectionthat measures a waveform of an input signal with a predeterminedsampling frequency, a frequency domain transforming section thattransforms the waveform measured by the signal measuring section into aspectrum of a predetermined frequency range, a spectrum compensatingsection that detects a non-symmetric sideband in the predeterminedfrequency range between a sideband that is higher in frequency than afundamental frequency of the input signal and a sideband that is lowerin frequency than the fundamental frequency of the input signal, andcompensates the spectrum obtained by the frequency domain transformingsection in accordance with frequency components in the detectednon-symmetric sideband, and a jitter measuring section that measures thejitter of the clock signal under measurement based on the spectrum whichhas been compensated by the spectrum compensating section.

According to the eleventh aspect related to the innovations herein, oneexemplary recording medium may include a recording medium storingthereon a program that causes a computer to function as a test apparatusfor testing a device under test. The program causes the computer tofunction as a measuring apparatus that measures jitter of a clock signalunder measurement output from the device under test, and a judgingsection that judges whether the device under test is acceptable based onthe jitter measured by the measuring apparatus. Here, the program causesthe computer functioning as the measuring apparatus to function as asignal measuring section that measures a waveform of an input signalwith a predetermined sampling frequency, a frequency domain transformingsection that transforms the waveform measured by the signal measuringsection into a spectrum of a predetermined frequency range, a spectrumcompensating section that detects a non-symmetric sideband in thepredetermined frequency range between a sideband that is higher infrequency than a fundamental frequency of the input signal and asideband that is lower in frequency than the fundamental frequency ofthe input signal, and compensates the spectrum obtained by the frequencydomain transforming section in accordance with frequency components inthe detected non-symmetric sideband, and a jitter measuring section thatmeasures the jitter of the clock signal under measurement based on thespectrum which has been compensated by the spectrum compensatingsection.

According to the twelfth aspect related to the innovations herein, oneexemplary program may include a program causing a computer to functionas a test apparatus for testing a device under test. The program causesthe computer to function as a measuring apparatus that measures jitterof a clock signal under measurement output from the device under test,and a judging section that judges whether the device under test isacceptable based on the jitter measured by the measuring apparatus.Here, the program causes the computer functioning as the measuringapparatus to function as a signal measuring section that measures awaveform of an input signal with a predetermined sampling frequency, afrequency domain transforming section that transforms the waveformmeasured by the signal measuring section into a spectrum of apredetermined frequency range, a spectrum compensating section thatdetects a non-symmetric sideband in the predetermined frequency rangebetween a sideband that is higher in frequency than a fundamentalfrequency of the input signal and a sideband that is lower in frequencythan the fundamental frequency of the input signal, and compensates thespectrum obtained by the frequency domain transforming section inaccordance with frequency components in the detected non-symmetricsideband, and a jitter measuring section that measures the jitter of theclock signal under measurement based on the spectrum which has beencompensated by the spectrum compensating section.

According to the thirteenth aspect related to the innovations herein,one exemplary measuring apparatus may include a measuring apparatus formeasuring jitter of a clock signal under measurement. The measuringapparatus includes a signal measuring section that measures a waveformof an input signal with a predetermined sampling frequency, a frequencydomain transforming section that transforms the waveform measured by thesignal measuring section into a spectrum of a predetermined frequencyrange, a single sideband spectrum generating section that receives thespectrum of the waveform output from the signal measuring section, andgenerates a single sideband spectrum whose sideband is one of an uppersideband and a lower sideband of the received spectrum, where the uppersideband is higher in frequency than a fundamental frequency of theinput signal and the lower sideband is lower in frequency than thefundamental frequency of the input signal, and a jitter measuringsection that measures the jitter of the clock signal under measurementbased on the single sideband spectrum generated by the single sidebandspectrum generating section.

According to the fourteenth aspect related to the innovations herein,one exemplary test apparatus may include a test apparatus for testing adevice under test. The test apparatus includes a measuring apparatusthat measures jitter of a clock signal under measurement output from thedevice under test, and a judging section that judges whether the deviceunder test is acceptable based on the jitter measured by the measuringapparatus. Here, the measuring apparatus includes a signal measuringsection that measures a waveform of an input signal with a predeterminedsampling frequency, a frequency domain transforming section thattransforms the waveform measured by the signal measuring section into aspectrum of a predetermined frequency range, a single sideband spectrumgenerating section that receives the spectrum of the waveform outputfrom the signal measuring section, and generates a single sidebandspectrum whose sideband is one of an upper sideband and a lower sidebandof the received spectrum, where the upper sideband is higher infrequency than a fundamental frequency of the input signal and the lowersideband is lower in frequency than the fundamental frequency of theinput signal, and a jitter measuring section that measures the jitter ofthe clock signal under measurement based on the single sideband spectrumgenerated by the single sideband spectrum generating section.

According to the fifteenth aspect related to the innovations herein, oneexemplary recording medium may include a recording medium storingthereon a program that causes a computer to function as a test apparatusfor testing a device under test. The program causes the computer tofunction as a measuring apparatus that measures jitter of a clock signalunder measurement output from the device under test, and a judgingsection that judges whether the device under test is acceptable based onthe jitter measured by the measuring apparatus. Here, the program causesthe computer functioning as the measuring apparatus to function as asignal measuring section that measures a waveform of an input signalwith a predetermined sampling frequency, a frequency domain transformingsection that transforms the waveform measured by the signal measuringsection into a spectrum of a predetermined frequency range, a singlesideband spectrum generating section that receives the spectrum of thewaveform output from the signal measuring section, and generates asingle sideband spectrum whose sideband is one of an upper sideband anda lower sideband of the received spectrum, where the upper sideband ishigher in frequency than a fundamental frequency of the input signal andthe lower sideband is lower in frequency than the fundamental frequencyof the input signal, and a jitter measuring section that measures thejitter of the clock signal under measurement based on the singlesideband spectrum generated by the single sideband spectrum generatingsection.

According to the sixteenth aspect related to the innovations herein, oneexemplary program may include a program causing a computer to functionas a test apparatus for testing a device under test. The program causesthe computer to function as a measuring apparatus that measures jitterof a clock signal under measurement output from the device under test,and a judging section that judges whether the device under test isacceptable based on the jitter measured by the measuring apparatus.Here, the program causes the computer functioning as the measuringapparatus to function as a signal measuring section that measures awaveform of an input signal with a predetermined sampling frequency, afrequency domain transforming section that transforms the waveformmeasured by the signal measuring section into a spectrum of apredetermined frequency range, a single sideband spectrum generatingsection that receives the spectrum of the waveform output from thesignal measuring section, and generates a single sideband spectrum whosesideband is one of an upper sideband and a lower sideband of thereceived spectrum, where the upper sideband is higher in frequency thana fundamental frequency of the input signal and the lower sideband islower in frequency than the fundamental frequency of the input signal,and a jitter measuring section that measures the jitter of the clocksignal under measurement based on the single sideband spectrum generatedby the single sideband spectrum generating section.

According to the seventeenth aspect related to the innovations herein,one exemplary electronic device may include an electronic device thatincludes therein an AD converter and a data processing section thatmeasures noise generated by the AD converter. The data processingsection includes a spectrum compensating section that receives aspectrum of a discrete waveform which is output from the AD converter inresponse to an input signal, and compensates the received spectrum inaccordance with a non-symmetric sideband between an upper sideband and alower sideband of the received spectrum, where the upper and lowersidebands are defined with respect to a fundamental frequency of theinput signal, and a phase noise waveform calculating section thatcalculates a phase noise waveform of the discrete waveform based on thespectrum which has been compensated by the spectrum compensatingsection.

According to the eighteenth aspect related to the innovations herein,one exemplary electronic device may include an electronic device thatincludes therein an AD converter and a data processing section thatmeasures noise generated by the AD converter. The data processingsection includes a single sideband spectrum generating section thatreceives a spectrum of a discrete waveform which is output from the ADconverter, and generates a single sideband spectrum whose sideband isone of an upper sideband and a lower sideband of the received spectrum,where the upper sideband is higher in frequency than a fundamentalfrequency of the input signal and the lower sideband is lower infrequency than the fundamental frequency of the input signal, and aphase noise waveform calculating section that calculates a phase noisewaveform of the discrete waveform based on the single sideband spectrum.

The summary clause does not necessarily describe all necessary featuresof the embodiments of the present invention. The present invention mayalso be a sub-combination of the features described above. The above andother features and advantages of the present invention will become moreapparent from the following description of the embodiments taken inconjunction with the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates an exemplary configuration of a measuring apparatus200 relating to an embodiment of the present invention.

FIG. 2 illustrates an exemplary configuration of a data processingsection 24.

FIG. 3A illustrates an example of the spectrum output from a firstfrequency domain transforming section 20.

FIG. 3B illustrates the spectrum obtained as a result of eliminating theline spectra of the harmonics from the spectrum illustrated in FIG. 3A.

FIG. 3C illustrates the spectrum obtained as a result of eliminating thenegative frequency components from the spectrum illustrated in FIG. 3B.

FIG. 4A illustrates an example of the spectrum input into a spectrumcompensating section 40.

FIG. 4B illustrates an example of the spectrum obtained by the spectrumcompensating section 40 by compensating a non-symmetric sideband.

FIG. 5A illustrates another example of the spectrum input into thespectrum compensating section 40.

FIG. 5B illustrates an example of the spectrum obtained by compensatinga non-symmetric sideband in the spectrum illustrated in FIG. 5A.

FIG. 6A illustrates an exemplary phase noise spectrum.

FIG. 6B illustrates an exemplary phase noise spectrum.

FIG. 7 illustrates an ENOB_(Q) measured by using a conventional methodand an ENOB_(T) measured by using the measuring apparatus 200.

FIG. 8 illustrates the ENOB_(Q) measured by using the conventionalmethod and the ENOB_(T) measured by using the measuring apparatus 200.

FIG. 9 illustrates an exemplary configuration of the phase noisewaveform calculating section 30.

FIG. 10 illustrates an example of an analytic signal generated by ananalytic signal generating section 62.

FIG. 11 illustrates an example of the instantaneous phase calculated byan instantaneous phase calculating section 64.

FIG. 12 illustrates an example of the instantaneous phase noisecalculated by an instantaneous phase noise calculating section 66.

FIG. 13A illustrates another example of the spectrum output from thefirst frequency domain transforming section 20.

FIG. 13B illustrates an example of the spectrum obtained as a result ofeliminating the harmonic components from the spectrum.

FIG. 14 is a flow chart illustrating an exemplary operation of themeasuring apparatus 200 described with reference to FIGS. 2 to 13B.

FIG. 15 illustrates another exemplary configuration of the dataprocessing section 24.

FIG. 16 illustrates an example of the spectrum supplied to a singlesideband spectrum generating section 34 and an example of the singlesideband spectrum generated by the single sideband spectrum generatingsection 34.

FIG. 17 illustrates another example of the spectrum supplied to thesingle sideband spectrum generating section 34, and another example ofthe single sideband spectrum generated by the single sideband spectrumgenerating section 34.

FIG. 18A illustrates the phase noise waveform in the time domain whichis calculated from the single sideband spectrum illustrated in FIG. 16.

FIG. 18B is a histogram illustrating the phase noise waveformillustrated in FIG. 18A.

FIG. 19A illustrates the phase noise waveform in the time domain whichis calculated from the single sideband spectrum illustrated in FIG. 17.

FIG. 19B is a histogram illustrating the phase noise waveformillustrated in FIG. 19A.

FIG. 20 illustrates, as an example, the SNR values calculated by an SNRcalculating section 26.

FIG. 21 is a flowchart illustrating an exemplary operation of themeasuring apparatus 200 described with reference to FIGS. 15 to 20.

FIG. 22 illustrates an exemplary configuration of a measuring apparatus100 relating to an embodiment of the present invention.

FIG. 23 illustrates another exemplary configuration of the measuringapparatus 1.00.

FIG. 24A illustrates the measurement results of the peak-to-peak valueof the instantaneous phase noise or the measurement results of thepeak-to-peak value of the phase jitter.

FIG. 24B illustrates the measurement results of the RMS value of thejitter.

FIG. 25 illustrates a further different example of the configuration ofthe measuring apparatus 100.

FIG. 26A illustrates an exemplary configuration of a test apparatus 600relating to an embodiment of the present invention.

FIG. 26B illustrates an exemplary configuration of a test apparatus 700relating to an embodiment of the present embodiment.

FIG. 27 illustrates an exemplary configuration of a computer 1900.

FIG. 28A illustrates, as an example, the relation between the ENOB of anAD converter and the frequency of an analog input into the AD converter.

FIG. 28B illustrates, as an example, the spectrum obtained by performingthe Fourier transform on an output from the AD converter.

FIG. 29 illustrates a different method to measure jitter based on thespectrum obtained by performing the Fourier transform on the output fromthe AD converter.

DESCRIPTION OF EXEMPLARY EMBODIMENTS

Some aspects of the invention will now be described based onembodiments, which do not intend to limit the scope of the presentinvention, but exemplify the invention. All of the features and thecombinations thereof described in the embodiments are not necessarilyessential to the invention.

FIG. 1 illustrates an exemplary configuration of a measuring apparatus200 relating to an embodiment of the present invention. The measuringapparatus 200 is configured to measure jitter which may be generated byan AD converter 400. The measuring apparatus 200 includes therein areference signal generating section 16, a clock generating section 10, abuffer memory 22, a data processing section 24, an SNR calculatingsection 26, and an effective bits measuring section 80.

The reference signal generating section 16 generates an analog referencesignal as an input signal to be applied to the AD converter 400. Thereference signal generating section 16 may generate a periodic signalhaving a constant period, and apply the generated periodic signal to theAD converter 400. For example, the reference signal generating section16 may apply a sinusoidal input signal to the AD converter 400, forexample. The reference signal generating section 16 preferably generatesan input signal having small jitter.

The clock generating section 10 inputs into the AD converter 400 asampling clock used for the sampling of the input signal. For example,the clock generating section 10 may generate a clock signal having aconstant period, and supply the generated clock signal to the ADconverter 400. The clock generating section 10 preferably generates asampling clock with no jitter or as small jitter as possible. Themeasuring apparatus 200 may be configured without the clock generatingsection 10. In this case, the measuring apparatus 200 may receive asampling clock from an external oscillator, and supply the receivedsampling clock to the AD converter 400.

The AD converter 400 converts the analog input signal supplied theretofrom the reference signal generating section 16 into a discretewaveform. Hereinafter, the signal output from the AD converter 400 issimply referred to as “the discrete waveform”. For example, the ADconverter 400 detects the level of the input signal in accordance witheach rising edge of the sampling clock supplied thereto from the clockgenerating section 10, and outputs a digital data sequence, or an outputcode sequence, corresponding to the detected level of the input signal.

The buffer memory 22 stores thereon the discrete waveform, or thedigital data sequence, output from the AD converter 400. The dataprocessing section 24 processes the discrete waveform data stored on thebuffer memory 22, to generate data to be supplied to the SNR calculatingsection 26. For example, the data processing section 24 may generatedata indicating the phase noise in the discrete waveform based on thediscrete waveform data.

The data processing section 24 may generate data indicating the phasenoise generated by the AD converter 400. For example, the dataprocessing section 24 may generate noise data which contains the phasenoise generated by the AD converter 400 such as the aperture jitter butdoes not contain the amplitude noise generated by the AD converter 400such as the quantization noise.

The data processing section 24 may generate a phase noise waveform inthe time domain, or may generate a phase noise spectrum in the frequencydomain. The configurations and operations of the data processing section24 to generate the phase noise waveform in the time domain and the phasenoise spectrum in the frequency domain are separately described later.

The SNR calculating section 26 calculates the signal-to-noise ratio SNRin the discrete waveform output from the AD converter 400, based on thedata supplied thereto from the data processing section 24. The effectivebits measuring section 80 measures the effective number of bits ENOB ofthe AD converter 400, based on the SNR calculated by the SNR calculatingsection 26. The operations of the SNR calculating section 26 and theeffective bits measuring section 80 will be described later withreference to the equations 4 to 7.

With the configuration illustrated in FIG. 1, the measuring apparatus200 can measure the SNR of the discrete waveform output from the ADconverter 400 and the ENOB of the AD converter 400. When not required tomeasure the ENOB, the measuring apparatus 200 maybe configured withoutthe effective bits measuring section 80.

FIG. 2 illustrates an exemplary configuration of the data processingsection 24. According to the present example, the data processingsection 24 supplies data which represents, in the frequency domain, thephase noise in the discrete waveform output from the AD converter 400,to the SNR calculating section 26. The data processing section 24includes therein a first frequency domain transforming section 20, aspectrum compensating section 40, a phase noise waveform calculatingsection 30, and a second frequency domain transforming section 32.

The first frequency domain transforming section 20 transforms thediscrete waveform obtained by the AD converter 400 into a spectrumhaving a predetermined frequency range. For example, the first frequencydomain transforming section 20 may perform the Fourier transform on thedata sequence output from the AD converter 400, to calculate thespectrum.

The first frequency domain transforming section 20 calculates a spectrumhaving a frequency range from −fs/2 to fs/2, in correspondence with thesampling frequency fs of the sampling clock. The first frequency domaintransforming section 20 may eliminate the negative frequency componentsfrom the spectrum so as to obtain a spectrum having a frequency rangefrom zero to fs/2, and input the obtained spectrum into the spectrumcompensating section 40.

The spectrum compensating section 40 compensates the non-symmetricsidebands in the spectrum. Specifically speaking, the spectrumcompensating section 40 receives the spectrum output from the firstfrequency domain transforming section 20, and detects a non-symmetricportion between the two sidebands centered around the fundamentalfrequency of the input signal. Based on the detected non-symmetricportion, the spectrum compensating section 40 compensates the spectrumby multiplying the spectrum by a fixed number. The detailed operation ofthe spectrum compensating section 40 will be described later withreference to FIGS. 3A to 3C.

The phase noise waveform calculating section 30 measures the phase noisewaveform, that is to say, jitter in the input signal based on thecompensated spectrum obtained by the spectrum compensating section 40.The phase noise waveform calculating section 30 may generate an analyticsignal by performing the inverse Fourier transform on the compensatedspectrum, and measure the phase noise waveform based on the generatedanalytic signal. The detailed operation of the phase noise waveformcalculating section 30 will be described later with reference to FIGS. 9to 12.

The second frequency domain transforming section 32 transforms the phasenoise waveform calculated by the phase noise waveform calculatingsection 30 into a spectrum in the frequency domain. For example, thesecond frequency domain transforming section 32 may calculate thespectrum in the frequency domain by performing the Fourier transform onthe phase noise waveform.

According to the present example, the SNR calculating section 26calculates the SNR of the discrete waveform output from the AD converter400, based on the spectrum of the phase noise waveform which isextracted by the second frequency domain transforming section 32. TheSNR calculating section 26 may calculate the SNR by using the methoddescribed later with reference to the equation 4.

FIG. 3A illustrates an example of the spectrum output from the firstfrequency domain transforming section 20. The spectrum illustrated inFIG. 3A contains the line spectra of second to thirteenth harmonics ofthe fundamental component. FIG. 3B illustrates the resultant spectrumobtained by eliminating the line spectra of the harmonics from thespectrum illustrated in FIG. 3A. FIG. 3C illustrates the spectrumobtained as a result of eliminating the negative frequency componentsfrom the spectrum illustrated in FIG. 3B. In FIGS. 3A to 5B, fin denotesthe fundamental frequency of the input signal, and fs denotes thesampling frequency of the sampling clock. The spectrum in FIG. 3Ccontains noise components in addition to the fundamental component ofthe input signal.

As illustrated in FIG. 3A, the fundamental frequency of the input signalis not always positioned at the middle of the frequency range, or theobserved band of the spectrum. In other words, the upper sideband whichis in higher frequencies than the fundamental frequency and the lowersideband which is in lower frequencies than the fundamental frequencyare non-symmetric in the observed band of the spectrum. For thisnon-symmetric sidebands, the phase noise waveform calculating section 30can not accurately extract an analytic signal of the discrete waveformoutput from the AD converter 400 simply by performing the inverseFourier transform on the resultant spectrum obtained by eliminating thenegative frequency components as shown in FIG. 3C.

The technique disclosed in the above-mentioned U.S. Pat. No. 6,525,523generates an analytic signal by using a filter that passes apredetermined frequency band which is centered around the fundamentalfrequency of a signal under measurement. This technique, however, cannot measure the noise outside the predetermined frequency band of thefilter as mentioned earlier.

According to the present embodiment, the spectrum compensating section40 does not use a band limiting filter, but passes all of the frequencycomponents of the spectrum supplied thereto. Subsequently, to compensatethe above-mentioned non-symmetric portion, the spectrum compensatingsection 40 multiplies the spectrum by a constant number determined inaccordance with the non-symmetric portion. In this manner, the measuringapparatus 200 maintains the information about the noise contained in thebroad band of the discrete waveform output from the AD converter 400,and accurately generates an analytic signal of the discrete waveform. Asa result, the measuring apparatus 200 can accurately measure the jittergenerated by the AD converter 400.

The spectrum compensating section 40 may detect a non-symmetricsideband, with reference to the fundamental frequency of the inputsignal fin. For example, the spectrum compensating section 40 detectsthe non-symmetric sideband in an unbalanced spectrum, from the uppersideband which is higher in frequency than the fundamental frequency ofthe input signal fin, in the present example, from fin to fs/2, and thelower sideband which is lower in frequency than the fundamentalfrequency fin, in the present example, from 0 Hz to fin, in thefrequency range of the spectrum, in the present example, from 0 Hz tofs/2. Note that the non-symmetric sideband may be defined herein asfollows. The positive frequency range of the spectrum, from 0 Hz to fs/2in the present example, from the 2049 line to the 4096 line in theexemplary case of the FFT of 4096 points, is centered around thefundamental frequency of the input signal fin, so that the upper andlower sidebands overlap each other. In this case, one of the upper andlower sidebands may have a portion that does not overlap the other. Sucha portion may be referred herein to as the non-symmetric sideband. Oneexemplary method to detect such a non-symmetric sideband is describedwith reference to FIGS. 4A and 4B.

FIG. 4A illustrates an example of the spectrum input into the spectrumcompensating section 40. FIG. 4B illustrates an example of the spectrumobtained by the spectrum compensating section 40 by compensating thenon-symmetric sideband.

The spectrum compensating section 40 judges whether the fundamentalfrequency of the input signal fin, in the present example, the 3649line, is higher than the center frequency of the positive frequencyrange of the spectrum, in the present example, 4096·¾= the 3072 line. Asillustrated in FIG. 4A, when the fundamental frequency fin is higherthan the center frequency, the 3072 line, the above-mentionednon-symmetric sideband is the frequency range, which is lower infrequency than the fundamental frequency fin, from the DC component, inthe present example, the 2049 line, to the frequency fA, in the presentexample, fA=3649−(4096−3649)= the 3202 line.

FIG. 5A illustrates another example of the spectrum input into thespectrum compensating section 40. FIG. 5B illustrates an example of thespectrum obtained as a result of compensating the non-symmetric sidebandof the spectrum illustrated in FIG. 5A.

On the contrary to the spectrum shown in FIG. 4A, the fundamentalfrequency fin, the 2545 line, is lower than the center frequency, the3072 line, in the spectrum shown in FIG. 5A. In this case, thenon-overlapping portion between the non-symmetric sidebands is thefrequency range, which is higher in frequency than the fundamentalfrequency fin, in the present example, the frequency range from the 3041line to 4095 line.

The spectrum compensating section 40 may detect the non-overlappingportion between the non-symmetric sidebands by using the techniquedescribed above with reference to FIGS. 4A and 5A. The spectrumcompensating section 40 may prestore thereon the fundamental frequencyof the input signal. The spectrum compensating section 40 may obtain thespectrum of the fundamental frequency by detecting a line spectrumhaving the largest energy in the spectrum supplied thereto.

The spectrum compensating section 40 compensates the spectrum generatedby the first frequency domain transforming section 20 in a mannerdetermined by the detected non-symmetric sideband α. The spectrumcompensating section 40 may compensate the non-symmetry of the spectrumby increasing the frequency components in the non-symmetric sideband α.

When the spectrum is a power spectrum, the spectrum compensating section40 may double the frequency components in the non-symmetric sideband α,as illustrated in FIGS. 4B and 5B. When the spectrum is a complexspectrum, the spectrum compensating section 40 may multiply thefrequency components in the non-symmetric sideband α by √2. In otherwords, the spectrum compensating section 40 may compensate the spectrumby doubling the frequency components in the non-symmetric sideband α inpower equivalent.

Instead of increasing the frequency components in the non-symmetricsideband a, the spectrum compensating section 40 may compensate thespectrum by decreasing the frequency components outside thenon-symmetric sideband α, that is to say, the frequency components inthe frequency range from the 3202 line to the 4096 line in the exemplaryspectrum of FIG. 4A, the frequency components in the frequency rangefrom the 2049 line to the 3041 line in the exemplary spectrum of FIG.5A, are decreased by half in power equivalent, that is to say,decreasing the frequency components to half when the spectrum is a powerspectrum, and to 1/√2 when the spectrum is a complex spectrum. In theabove-described manner, the spectrum compensating section 40 cancompensate the non-symmetric spectrum.

The phase noise waveform calculating section 30 converts the spectrumgenerated by the compensation done by the spectrum compensating section40 into a signal in the time domain, and calculates the phase noisewaveform in the discrete waveform based on the signal in the time domainobtained by the conversion. For example, the phase noise waveformcalculating section 30 may calculate the jitter in the signal undermeasurement, based on the analytic signal which is obtained byperforming the inverse Fourier transform on the spectrum generated bythe spectrum compensating section 40. Receiving the spectrum whosenon-symmetry has already been compensated by the spectrum compensatingsection 40, the phase noise waveform calculating section 30 cancalculate an accurate analytic signal for the discrete waveform, therebyaccurately measuring the phase noise waveform of the discrete waveform.The second frequency domain transforming section 32 transforms the phasenoise waveform calculated by the phase noise waveform calculatingsection 30 into a phase noise spectrum in the frequency domain.

FIGS. 6A and 6B illustrate exemplary phase noise spectra. In FIGS. 6Aand 6B, the horizontal axis represents the offset frequency from thefundamental frequency of the input signal. FIG. 6A illustrates thespectrum for the phase noise waveform obtained in a case where thespectrum compensating section 40 does not compensate the spectrum of thediscrete waveform illustrated in FIG. 4A. In the spectrum shown in FIG.4A, a part of the lower sideband, −11.15 to 0 MHz, is truncated due tothe Nyquist zone, or the observed range, and thus can not be observed.Therefore, a difference of approximately 3 dB is present in the vicinityof 10 MHz in the phase noise spectrum as illustrated in FIG. 6A.

On the other hand, FIG. 6B illustrates the spectrum for the phase noisewaveform obtained in a case where the spectrum compensating section 40compensates the spectrum of the discrete waveform shown in FIG. 4A. Asexplained in the above, since the spectrum compensating section 40compensates the non-overlapping portion between the non-symmetricsidebands, the difference seen in FIG. 6A is not present in the phasenoise spectrum in FIG. 6B.

With the above-described configurations, the measuring apparatus 200 canobtain an accurate phase noise spectrum. The SNR calculating section 26calculates the SNR of the discrete waveform output from the AD converter400, based on the phase noise spectrum generated by the second frequencydomain transforming section 32. By referring to the equation 3, theSNR_(T) is represented by the following equation.

$\begin{matrix}\begin{matrix}{{SNR}_{T} = {10\; \log_{10}\frac{1}{\left( {2\pi \; f_{i\; n}\sigma_{\Delta\varphi}} \right)^{2}}}} \\{= {10\log_{10}\frac{1}{\left( {\frac{2\pi}{T_{i\; n}}\sigma_{\Delta \; \varphi}} \right)^{2}}}} \\{= {10\log_{10}{\frac{1}{2\left\lbrack {\sum\limits_{g}{G_{\Delta\varphi\Delta\varphi}(f)}} \right\rbrack}\lbrack{dB}\rbrack}}}\end{matrix} & {{Equation}\mspace{14mu} 4}\end{matrix}$

Here, T_(in) denotes the period of the fundamental, and G_(ΔφΔφ)(f)denotes the phase noise spectrum. The SNR calculating section 26 maycalculate the SNR_(T) by using the equation 4. Which is to say, the SNRcalculating section 26 may calculate the SNR based on the value obtainedby adding together, or accumulating the individual frequency componentswithin a predetermined frequency range of the phase noise spectrum.

In place of the equation 4, the SNR calculating section 26 may calculatethe SNR by means of the following equation.

${SNR}_{T} = {10\log_{10}\frac{0.5}{\sum\limits_{f}\frac{G_{\Delta\varphi\Delta\varphi}(f)}{enbw}}}$

Here, enbw denotes the equivalent noise bandwidth, which may bedetermined by a window function used by a window function multiplyingsection 14 described later with reference to FIG. 25. For example, whenthe window function multiplying section 14 uses the Hanning windowfunction, enbw may be set at 1.5.

The effective bits measuring section 80 measures the ENOB_(T) of the ADconverter 400, based on the SNR_(T) calculated by the SNR calculatingsection 26. Generally speaking, the ENOB is represented by the followingequation 5 based on the SNR. The equation 5 is transformed in thefollowing manner by using the equation 3.

$\begin{matrix}\begin{matrix}{{ENOB}_{T} = \frac{{SNR}_{T} - 1.76}{6.02}} \\{= {{{- 3.32}\log_{10}f_{i\; n}} - {3.32\log_{10}\sigma_{\Delta\varphi}} - 2.94}}\end{matrix} & {{Equation}\mspace{14mu} 5}\end{matrix}$

When the aliasing effects due to the Nyquist frequency are taken intoconsideration, the equation 5 is transformed as shown below.

$\begin{matrix}{{ENOB}_{T} \propto \left\{ \begin{matrix}{{{- 3.32}\log_{10}f_{i\; n}} - {3.32\log_{10}\sigma_{\Delta\varphi}}} & {f_{i\; n} < f_{Nyq}} \\{{{+ 3.32}\left( {{\log_{10}f_{i\; n}} - {2\log_{10}f_{Nyq}}} \right)} - {3.32\log_{10}\sigma_{\Delta\varphi}}} & {f_{Nyq} < f_{i\; n} < {\beta \; f_{Nyq}}} \\{{{- 3.32}\left( {{\log_{10}f_{i\; n}} - {2\log_{10}\beta}} \right)} - {3.32\log_{10}\sigma_{\Delta\varphi}}} & {{\beta \; f_{Nyq}} < f_{i\; n}}\end{matrix} \right.} & {{Equation}\mspace{14mu} 6}\end{matrix}$

Here, f_(Nyq) denotes the Nyquist frequency fs/2.

The effective bits measuring section 80 may measure the ENOB_(T) byusing one of the equations 5 and 6. The ENOB_(T) takes a local maximalvalue when the fundamental frequency of the input signal fin falls in arange from f_(Nyq) to 2f_(Nyq). In other words, the equation 6 providesthe best-case value of the ENOB. The worst-case value of the ENOB isgiven by the following equation.

ENOB_(T) ∝−3.32 log₁₀ f _(in)−3.32 log₁₀ σ_(Δφ)  Equation 7

FIGS. 7 and 8 each illustrate the ENOB_(Q) measured by using aconventional method and the ENOB_(T,RMS) measured by using the measuringapparatus 200. Here, FIG. 7 illustrates the measurement results obtainedwhen the AD converter 400 generates large aperture jitter. FIG. 8illustrates the measurement results obtained when the AD converter 400generates small aperture jitter. Specifically speaking, the measurementresults shown in FIG. 7 are obtained by measuring the ENOB under thecondition that the amount of the aperture jitter is degraded by varyingthe amplitude of the sampling clock approximately tenfold withoutvarying the frequency of the sampling clock, when compared to theamplitude and frequency used for obtaining the measurement results shownin FIG. 8. In FIGS. 7 and 8, the horizontal axis logarithmicallyrepresents the fundamental frequency of the input signal fin.

In a case where the aperture jitter is large and the quantization noisethus has relatively low influence as shown in FIG. 7, the measurementresults obtained by using the conventional method are substantially thesame as the measurement results obtained by using the measuringapparatus 200. Which is to say, the measurement results shown in FIG. 7verify that the measuring apparatus 200 can accurately measure the ENOBwhen the aperture jitter is large.

In a case where the aperture jitter is relatively small as shown in FIG.8, the ENOB_(Q) and the ENOB_(T,RMS) are substantially the same in theregion of fin>100 MHz in which the aperture jitter is dominant. In theregion of fin<100 MHz in which the quantization noise is dominant, theENOB_(Q) remains at a substantially constant value but the ENOB_(T, RMS)linearly varies in accordance with the variation in the logarithmicfrequency. This linear change corresponds to the equation 5. Which is tosay, the measuring apparatus 200 has been verified to be capable ofaccurately measuring the ENOB_(T, RMS).

As is apparent from FIG. 8, the measurement results of the ENOB whichare obtained when small aperture jitter is generated favorablycorrespond to the equation 6. Here, FIG. 8 shows the theoretical valuesobtained by the equation 6 by using the straight lines. This means thatthe equation 6 has been verified to provide the best-case value of theENOB. Also, as is apparent from FIG. 7, the measurement results of theENOB which are obtained when large aperture jitter is generatedfavorably correspond to the equation 7. This means that the equation 7has been verified to provide the worst-case value of the ENOB.

The effective bits measuring section 80 may calculate the best-casevalue of the ENOB by using the equation 6. The effective bits measuringsection 80 may calculate the worst-case value of the ENOB by using theequation 7. Note that the equations 6 and 7 represent a proportionalrelation. Hence, once the ENOB is measured in association with a singlefrequency, the measured value of the ENOB and the equations 6 and 7 canprovide the best and worst-case values of the ENOB in association withthe entire band.

Based on a phase noise spectrum obtained in association with an inputsignal having a predetermined frequency, the effective bits measuringsection 80 may calculate at least one of the best and worst-case valuesof the ENOB observed when the AD converter receives an input signalhaving a frequency different from the predetermined frequency. Theeffective bits measuring section 80 may calculate the best andworst-case values of the ENOB in association with a predetermined band.

The reference signal generating section 16 may input, into the ADconverter 400, the input signal having a frequency lower than theNyquist frequency of the sampling clock, fs/2. Even in this case, theeffective bits measuring section 80 can calculate the best andworst-case values of the ENOB observed when the AD converter 400receives the input signal having a frequency higher than the Nyquistfrequency, for example. As a result, the measuring apparatus 200 canmeasure the ENOB of the AD converter 400 in association with apredetermined band, by using the reference signal generating section 16which is configured by using a relatively low-performance and low-costelement.

FIG. 9 illustrates an exemplary configuration of the phase noisewaveform calculating section 30. The phase noise waveform calculatingsection 30 includes therein an analytic signal generating section 62, aninstantaneous phase calculating section 64, and an instantaneous phasenoise calculating section 66.

FIG. 10 illustrates an example of the analytic signal generated by theanalytic signal generating section 62. The analytic signal generatingsection 62 performs the inverse Fourier transform on the spectrumgenerated by the spectrum compensating section 40, to generate ananalytic signal in the time domain. The analytic signal may be thewaveform of the signal under measurement as the real part thereof, andthe waveform obtained by 90-degree phase shifting the signal undermeasurement as the imaginary part thereof, for example. The analyticsignal may be obtained in such a manner that the resultant spectrumobtained by eliminating the negative frequency components as shown inFIG. 3C is supplied to the spectrum compensating section 40, thespectrum compensating section 40 compensates the non-symmetric sideband,and the spectrum generated by the compensation is subjected to theinverse Fourier transform by the analytic signal generating section 62.

FIG. 11 illustrates an example of the instantaneous phase calculated bythe instantaneous phase calculating section 64. The instantaneous phasecalculating section 64 calculates the instantaneous phase of the signalunder measurement based on the analytic signal calculated by theanalytic signal generating section 62. For example, the instantaneousphase calculating section 64 may calculate the instantaneous phase ofthe signal under measurement by obtaining the arctangent of the real andimaginary parts of the analytic signal.

Here, the function indicating the instantaneous phase which is obtainedby calculating the arctangent of the real and imaginary parts of theanalytic signal is expressed by the principal values in the range from−n to n, for example. In other words, the function of the instantaneousphase is a discontinuous function in which a value n shows discontinuityfollowed by a value −n. In this case, the instantaneous phasecalculating section 64 may unwrap the instantaneous phase bysequentially adding the value 2n to the instantaneous phase at thepoints of discontinuity, for example, thereby calculating a continuousinstantaneous phase as illustrated in FIG. 11.

FIG. 12 illustrates an example of the instantaneous phase noisecalculated by the instantaneous phase noise calculating section 66. Theinstantaneous phase noise calculating section 66 calculates theinstantaneous phase noise of the signal under measurement based on theinstantaneous phase calculated by the instantaneous phase calculatingsection 64. For example, the instantaneous phase noise calculatingsection 66 may calculate the instantaneous phase noise by eliminating alinear component from the instantaneous phase. The instantaneous phasenoise calculating section 66 may calculate the linear component byapproximating the instantaneous phase with a straight line based on, forexample, the least square method.

According to the above-described processing, each value of theinstantaneous phase noise is expressed in unit of radian. Theinstantaneous phase noise calculating section 66 may convert theinstantaneous phase noise expressed in unit of radian into theinstantaneous phase noise expressed in time, based on the fundamentalfrequency of the signal under measurement. For example, theinstantaneous phase noise calculating section 66 may calculate theinstantaneous phase noise in time by dividing the instantaneous phasenoise Δφ(t) expressed in unit of radian by 2πfin. The instantaneousphase noise calculating section 66 may supply the calculatedinstantaneous phase noise to the second frequency domain transformingsection 32.

The phase noise waveform calculating section 30 can also calculate thejitter of the signal under measurement, based on the instantaneous phasenoise calculated by the instantaneous phase noise calculating section66. For example, the phase noise waveform calculating section 30 canobtain the timing jitter sequence of the input signal by sampling thevalue of the instantaneous phase noise at the timing of each rising edgeof the input signal.

FIG. 13A illustrates another example of the spectrum output from thefirst frequency domain transforming section 20. As illustrated in FIG.13A, the spectrum of the discrete waveform has the harmonic componentsof the fundamental at fin, at the following frequencies: f2, f3, f4, . .. . The spectrum compensating section 40 may eliminate the harmoniccomponents before or after the compensation of the non-symmetricsideband described with reference to FIGS. 4A to 5B. FIG. 13Billustrates an example of the resultant spectrum obtained by eliminatingthe harmonic components.

The harmonic components are present at the frequencies equal to theintegral multiples of the fundamental frequency fin. Note that, however,some of the harmonic components associated with the frequencies outsidethe frequency range of the spectrum, in the present example, thefrequency range from 0 to fs/2, are folded at the frequencies of theborders defining the frequency range, in the present example, 0 and theNyquist frequency of fs/2, so as to be present within the frequencyrange. The spectrum compensating section 40 may detect the harmoniccomponents to be eliminated, based on the number of sample points forthe Fourier transform, in the present example, 4096 sample points, andthe fundamental frequency of the input signal fin.

The following describes an exemplary method to detect the harmoniccomponents, with reference to FIG. 13A. To begin with, the spectrumcompensating section 40 detects the second-order harmonic component.Here, the second-order harmonic component is originally expected toappear at the frequency of 2 fin, in the present example, 2 fin=1600.Therefore, the spectrum compensating section 40 may judge whether thefrequency 2 fin falls within the frequency range of the spectrum. Whenthe frequency 2 fin falls within the frequency range of the spectrum, inthe present example, 0<f<2048, the spectrum compensating section 40eliminates the component at the frequency 2 fin, as the second-orderharmonic component. Here, eliminating a frequency component may indicatethat the level of the frequency component is changed to zero.

When the frequency 2fin does not fall within the frequency range, notshown in FIG. 13A, the spectrum compensating section 40 calculates thefrequency f2_folded which is obtained by folding the frequency 2 finwith respect to the frequency fs/2. Here, the frequency f2_folded may beexpressed as fs/2+(fs/2−2 fin).

Subsequently, the spectrum compensating section 40 detects thethird-order harmonic component based on the fundamental frequency of theinput signal fin. The third-order harmonic component appears at thefrequency of f3, in the present example, f3=2400. Similarly to the caseof the second-order harmonic component, the spectrum compensatingsection 40 judges whether the frequency associated with the third-orderharmonic component falls within the frequency range. In the presentexample, the frequency f3 of the third-order harmonic component isoutside the frequency range. Therefore, the spectrum compensatingsection 40 calculates the frequency f3_folded, in the present example,1696=2048−(2400−2048), which is obtained when folding the frequency f3with respect to the frequency fs/2. Here, the frequency f3_folded fallswithin the frequency range. Hence, the spectrum compensating section 40changes the level of the frequency component at the frequency f3_foldedto zero.

Subsequently, the spectrum compensating section 40 detects thefourth-order harmonic component based on the fundamental frequency ofthe input signal fin. In the present example, the fourth-order harmoniccomponent appears at the frequency of f4, in the present example,f4=3200. Similarly to the case of the third-order harmonic component,the spectrum compensating section 40 judges whether the frequencyassociated with the fourth-order harmonic component falls within thefrequency range. In the present example, the frequency f4 of thefourth-order harmonic component is outside the frequency range.Therefore, the spectrum compensating section 40 calculates the frequencyf4_folded, in the present example, f4_folded=896, which is obtained whenfolding the frequency f4 with respect to the frequency fs/2.

In the present example, the frequency f6 associated with the sixth-orderharmonic component, in the present example, f6=4800, is outside thefrequency range. Therefore, the spectrum compensating section 40calculates the frequency f6_folded, in the present example, f6folded=−704, which is obtained when folding the frequency f6 withrespect to the frequency fs/2. Since the calculated frequency f6 foldedis a negative value, the spectrum compensating section 40 calculates thefrequency f6_folded2 which is obtained by further folding the frequencyf6_folded with respect to the frequency 0. The spectrum compensatingsection 40 then changes the level of the frequency component at thefrequency f6_folded2 to zero.

By repeatedly performing the above processing, the spectrum compensatingsection 40 can eliminate the harmonic components from the spectrum, sothat the spectrum is left with the fundamental wave component and therandom noise component. Therefore, the measuring apparatus 200 canaccurately measure the aperture jitter generated by the AD converter400. Here, the highest order of the harmonic components to be eliminatedby the spectrum compensating section 40 may be determined in advance.The spectrum compensating section 40 may eliminate the harmoniccomponents whose levels are equal to or higher than a predeterminedlevel.

The clock generating section 10 may generate the sampling clock whosesampling frequency fs is coherent with the fundamental frequency fin.With this condition being satisfied, the harmonic components appear asline spectra in the spectrum. As a result, the measuring apparatus 200can minimize the amount of operations required to be performed toeliminate the harmonic components.

FIG. 14 is a flowchart illustrating an exemplary operation of themeasuring apparatus 200 described with reference to FIGS. 2 to 13B. Asdescribed earlier, the AD converter 400 measures the waveform of theinput signal with the predetermined sampling frequency in the step S300.Subsequently, the first frequency domain transforming section 20performs the Fourier transform on the discrete waveform data output fromthe AD converter 400, to obtain the spectrum in the step S302.

After this, the spectrum compensating section 40 eliminates the harmoniccomponents of the fundamental in the input signal from the spectrum inthe step S304. After eliminating the harmonic components, the spectrumcompensating section 40 detects the non-symmetric frequency range in thespectrum, and compensates the spectrum in the manner determined by thedetected non-symmetric frequency components in the step S306. In thestep S306, alternatively, the spectrum compensating section 40 mayeliminate the harmonic components after compensating the spectrum in themanner determined by the detected non-symmetric frequency components.

Following this, the phase noise waveform calculating section 30 performsthe inverse Fourier transform on the components in the entire band ofthe spectrum output from the spectrum compensating section 40, togenerate the analytic signal for the discrete waveform in the step S308.The phase noise waveform calculating section 30 calculates the phasenoise waveform of the discrete waveform based on the generated analyticsignal in the step S312.

The second frequency domain transforming section 32 performs the Fouriertransform on the phase noise waveform of the discrete waveform, tocalculate the phase noise spectrum in the step S314. Subsequently, theSNR calculating section 26 calculates the SNR by using the phase noisespectrum in the step S316. The effective bits measuring section 80 thenmeasures the ENOB based on the SNR in the step S318.

FIG. 15 illustrates another exemplary configuration of the dataprocessing section 24. According to the present example, the dataprocessing section 24 supplies the phase noise of the discrete waveformoutput from the AD converter 400, that is to say, the data in the timedomain, to the SNR calculating section 26. In the present example, thedata processing section 24 includes therein the first frequency domaintransforming section 20, a single sideband spectrum generating section34, and the phase noise waveform calculating section 30.

The first frequency domain transforming section 20 may be the same asthe first frequency domain transforming section 20 described withreference to FIG. 2. The single sideband spectrum generating section 34receives the spectrum of the discrete waveform which is generated by thefirst frequency domain transforming section 20, and generates a singlesideband spectrum based on the received spectrum. The operation of thesingle sideband spectrum generating section 34 will be described laterwith reference to FIGS. 16 and 17.

The phase noise waveform calculating section 30 calculates the phasenoise waveform in the discrete waveform output from the AD converter 400based on the single sideband spectrum generated by the single sidebandspectrum generating section 34. The phase noise waveform calculatingsection 30 may have the same functions and configurations as the phasenoise waveform calculating section 30 described with reference to FIG.2.

For example, the phase noise waveform calculating section 30 may performthe inverse Fourier transform on the single sideband spectrum. Since thesingle sideband spectrum does not contain the negative frequencycomponents, the phase noise waveform calculating section 30 can obtainthe analytic signal of the discrete waveform by performing the inverseFourier transform on the single sideband spectrum. The phase noisewaveform calculating section 30 may calculate the phase noise waveformin the time domain Δφ(t) based on the analytic signal, in the mannerdescribed with reference to FIG. 9.

FIG. 16 illustrates an example of the input spectrum supplied to thesingle sideband spectrum generating section 34 and an example of thesingle sideband spectrum generated by the single sideband spectrumgenerating section 34. The upper spectrum in FIG. 16 is the inputspectrum supplied to the single sideband spectrum generating section 34,and the lower spectrum in FIG. 16 is the single sideband spectrumgenerated by the single sideband spectrum generating section 34.

The single sideband spectrum generating section 34 may detect an uppersideband which is higher in frequency than the fundamental frequency ofthe input signal fin and a lower sideband which is lower in frequencythan the fundamental frequency of the input signal fin in the positivefrequency range of the input spectrum supplied thereto, that is to say,the upper spectrum in FIG. 16. Subsequently, the single sidebandspectrum generating section 34 generates the single sideband spectrum,that is to say, the lower spectrum in FIG. 16, whose sideband isequivalent to one of the detected upper and lower sidebands. Since thesingle sideband spectrum generating section 34 generates theabove-described single sideband spectrum, the phase noise waveformcalculating section 30 can generate an accurate phase noise waveformeven when the upper and lower sidebands are asymmetrical in the spectrumof the discrete waveform.

Here, the single sideband spectrum generating section 34 preferablyselects one of the upper and lower sidebands which has a largerbandwidth, for the sideband of the single sideband spectrum to begenerated. With this condition being satisfied, the phase noise waveformcalculated by the phase noise waveform calculating section 30 cancontain a noise component associated with a wide band.

In the example shown in FIG. 16, the upper sideband has a largerbandwidth than the lower sideband. Therefore, the single sidebandspectrum generating section 34 selects the upper sideband of thespectrum supplied thereto as the sideband of the single sidebandspectrum. In this case, the single sideband spectrum generating section34 generates the single sideband spectrum by shifting the frequencycomponent at the fundamental frequency fin and the frequency componentswithin the upper sideband in the spectrum of the discrete waveform, thatis to say, the upper spectrum in FIG. 16, in such a manner that thefrequency component at the fundamental frequency fin is positioned asthe dc component of the single sideband spectrum, that is to say, thelower spectrum in FIG. 16. Here, the single sideband spectrum generatingsection 34 may set the levels of the frequency components other than thefundamental at frequency fin and the frequency components beingcontained in the upper sideband, as zero.

Which is to say, the single sideband spectrum generating section 34 mayshift the fundamental and the frequency components within the uppersideband in the received spectrum, so that the shifted frequencycomponents are positioned at dc and its single sideband, with keepingthe normal ascending order, or without changing the order, of thefrequency components in the frequency axis. The single sideband spectrumgenerating section 34 may generate the single sideband spectrum Sa (f)from the spectrum Sin (f) supplied thereto by referring to the followingequation.

$\begin{matrix}{{S_{a}(f)} = \left\{ \begin{matrix}{S_{i\; n}\left( {f - f_{i\; n}} \right)} & {0 \leq f \leq f_{u}} \\0 & {{f < 0},{f > f_{u}}}\end{matrix} \right.} & {{Equation}\mspace{14mu} 8}\end{matrix}$

Here, f_(u) denotes the bandwidth of the upper sideband.

FIG. 17 illustrates another example of the spectrum supplied to thesingle sideband spectrum generating section 34, and another example ofthe single sideband spectrum generated by the single sideband spectrumgenerating section 34. According to the present example, the lowersideband has a larger bandwidth than the upper sideband in the receivedspectrum, that is to say, the upper spectrum in FIG. 17. Therefore, thesingle sideband spectrum generating section 34 selects the lowersideband of the received spectrum for the sideband of the singlesideband spectrum.

In the example shown in FIG. 17, the single sideband spectrum generatingsection 34 reverses the order, in the frequency axis, of the frequencycomponent at the fundamental frequency fin and the frequency componentswithin the lower sideband in the spectrum of the discrete waveform, thatis to say, the upper spectrum in FIG. 17. Subsequently, the singlesideband spectrum generating section 34 generates the single sidebandspectrum, that is to say, the lower spectrum in FIG. 17, by shifting thefrequency component at the fundamental frequency fin and the frequencycomponents in the lower sideband, which are in the reversed order, insuch a manner that the frequency component at the fundamental frequencyfin is positioned as the frequency component at dc fdc in the singlesideband spectrum. Here, the single sideband spectrum generating section34 may set the levels of the frequency components other than thefrequency component at the fundamental frequency fin and the frequencycomponents corresponding to the frequencies within the lower sideband,as zero.

Which is to say, the single sideband spectrum generating section 34 mayshift the fundamental and the frequency components within the lowersideband in the received spectrum, so that the shifted frequencycomponents are positioned at dc and its single sideband, in thedescending order, or with reversing the order, of the frequencycomponents in the frequency axis. The single sideband spectrumgenerating section 34 may generate the single sideband spectrum Sa (f)from the spectrum Sin (f) supplied thereto, by referring to thefollowing equation.

$\begin{matrix}{{S_{a}(f)} = \left\{ \begin{matrix}{S_{i\; n}\left( {- \left\lbrack {f - f_{i\; n}} \right\rbrack} \right)} & {0 \leq f \leq f_{l}} \\0 & {{f < 0},{f > f_{l}}}\end{matrix} \right.} & {{Equation}\mspace{14mu} 9}\end{matrix}$

Here, f₁ denotes the bandwidth of the lower sideband.

By performing the processing described with reference to FIGS. 16 and17, the single sideband spectrum generating section 34 can produce abroadband single sideband spectrum. Hence, the phase noise waveformcalculating section 30 can generate the analytic signal of the discretewaveform by performing the inverse Fourier transform on the singlesideband spectrum, with keeping the noise information in a wide band.

According to the exemplary processing described with reference to FIGS.16 and 17, the single sideband spectrum generating section 34 shifts thefrequency component at the positive fundamental frequency fin and thefrequency components within one of the sidebands such that the frequencycomponent at the positive fundamental frequency fin is positioned as thedc component fdc. According to different exemplary processing, however,the single sideband spectrum generating section 34 may shift thefrequency component at the negative fundamental frequency −fin and thefrequency components within one of the sidebands such that the frequencycomponent at the negative fundamental frequency −fin is positioned asthe dc component fdc.

The single sideband spectrum generating section 34 may eliminate theharmonic components in the single sideband spectrum by performing theprocessing which is performed by the spectrum compensating section 40 asdescribed with reference to FIGS. 13A and 13B. For example, the singlesideband spectrum generating section 34 may first eliminate the linespectra of the harmonic components contained in the spectrum suppliedthereto, and then generate the single sideband spectrum by performingthe processing described with reference to FIGS. 16 and 17.Alternatively, the single sideband spectrum generating section 34 mayfirst generate the single sideband spectrum, and then eliminate the linespectra of the harmonic components contained in the single sidebandspectrum. In this manner, the measuring apparatus 200 relating to thepresent example can accurately measure the random noise component.

The data processing section 24 described with reference to FIG. 15 canobtain an accurate phase noise waveform in the time domain. Which is tosay, in order that an accurate phase noise waveform is obtained from thespectrum of the discrete waveform, the upper and lower sidebands need tohave the same bandwidth in the spectrum when observed. As indicated byFIGS. 4A, 5A, 16, 17 and other drawings, however, the upper and lowersidebands rarely have the same bandwidth, or the fundamental frequencyis hardly positioned in the middle of the observed range.

Furthermore, the single sideband spectrum generating section 34 maycompensate the non-symmetric sideband in the single sideband spectrum byperforming the processing which is performed by the spectrumcompensating section 40 as described with reference to the step S306 inFIG. 14. For example, the single sideband spectrum generating section 34first doubles the individual frequency components in the input spectrumsupplied thereto in power equivalent, specifically, when the inputspectrum is a complex spectrum, the single sideband spectrum generatingsection 34 multiples the frequency components by √2 in power equivalent,and then convert the compensated spectrum into the single sidebandspectrum. Alternatively, the single sideband spectrum generating section34 may first generate the single sideband spectrum from the inputspectrum, and then double the individual frequency components in thesingle sideband spectrum in power equivalent.

With the above-described configurations, the data processing section 24described with reference to FIG. 15 can generate the single sidebandspectrum whose dc component is shifted from the fundamental component inthe spectrum which is obtained as a result of compensating thenon-symmetric sideband, and use the generated single sideband spectrumfor calculating the phase noise waveform. Consequently, the dataprocessing section 24 can calculate an accurate phase noise waveform.

When the data processing section 24 has the functions and configurationsdescribed with reference to FIG. 15, the SNR calculating section 26calculates the SNR for the discrete waveform based on the phase noisewaveform in the time domain which has been calculated by the dataprocessing section 24. For example, the SNR calculating section 26 maycalculate the SNR based on the time-domain values obtained from thephase noise waveform in the time domain, such as the RMS value and thepeak-to-peak value.

FIG. 18A illustrates the phase noise waveform in the time domain whichis calculated from the single sideband spectrum illustrated in FIG. 16.FIG. 18B is a histogram illustrating the phase noise waveformillustrated in FIG. 18A. The vertical axis in FIG. 18A corresponds tothe horizontal axis in FIG. 18B.

The SNR calculating section 26 may calculate the RMS value orpeak-to-peak value of the phase noise waveform supplied thereto from thedata processing section 24, based on the supplied phase noise waveformor the histogram of the supplied phase noise waveform. According to thepresent example, the RMS value is 127 μrad, and the peak-to-peak valueis 465 μrad.

FIG. 19A illustrates the phase noise waveform in the time domain whichis calculated from the single sideband spectrum illustrated in FIG. 17.FIG. 19B is a histogram illustrating the phase noise waveformillustrated in FIG. 19A. According to the present example, the RMS valueis 168 μrad, and the peak-to-peak value is 590 μrad.

The SNR calculating section 26 may calculate the SNR of the discretewaveform, based on the RMS value or peak-to-peak value of the phasenoise waveform. For example, the SNR calculating section 26 maycalculate the RMS value of the SNR (SNR_(T,RMS)) by assigning the RMSvalue of the phase noise waveform to the variable σ_(Δφ) in thefollowing equation.

$\begin{matrix}{{SNR}_{T,{RMS}} = {10\log_{10}{\frac{1}{\left( {\frac{2\pi}{T_{i\; n}}\sigma_{\Delta\varphi}} \right)^{2}}\lbrack{dB}\rbrack}}} & {{Equation}\mspace{14mu} 10}\end{matrix}$

Similarly, the SNR calculating section 26 may calculate the peak-to-peakvalue of the SNR (SNR_(T,PkPk)) by assigning the peak-to-peak value ofthe phase noise waveform to the variable d{Δφ} in the followingequation.

$\begin{matrix}{{SNR}_{T,{PkPk}} = {20\log_{10}{\frac{1}{\left( {\frac{2\pi}{T_{i\; n}}d\left\{ {\Delta\varphi} \right\}} \right)^{2}}\lbrack{dB}\rbrack}}} & {{Equation}\mspace{14mu} 11}\end{matrix}$

FIG. 20 illustrates, as an example, the SNR calculated by the SNRcalculating section 26. Specifically speaking, FIG. 20 illustrates theSNR which is calculated based on the RMS value of the phase noisewaveform, and the SNR which is calculated based on the peak-to-peakvalue of the phase noise waveform. The effective bits measuring section80 measures the ENOB of the AD converter 400 based on the SNR receivedfrom the SNR calculating section 26.

FIG. 21 is a flowchart illustrating an exemplary operation of themeasuring apparatus 200 described with reference to FIGS. 15 to 20.Here, the procedure from the step S300 to the step S304 in FIG. 21 isthe same as the procedure from the step S300 to the step S304 describedwith reference to FIG. 14, and therefore not explained here.

After eliminating the harmonic components of the spectrum, the singlesideband spectrum generating section 34 generates the single sidebandspectrum based on the resultant spectrum in the step S320. In the stepS320, the single sideband spectrum generating section 34 may compensatethe non-symmetric sideband in the single sideband spectrum, as mentionedearlier. After this, the phase noise waveform calculating section 30performs the inverse Fourier transform on the single sideband spectrum,to generate the analytic signal for the discrete waveform in the stepS322. Subsequently, the phase noise waveform calculating section 30calculates the phase noise waveform of the discrete waveform based onthe generated analytic signal, and calculates the time-domain valuesfrom the phase noise waveform, such as the RMS value and thepeak-to-peak value in the step S324.

Following this, the SNR calculating section 26 calculates the SNR basedon the time-domain values of the phase noise waveform in the step S316.The effective bits measuring section 80 then measures the ENOB based onthe SNR in the step S318. The effective bits measuring section 80 maycalculate the RMS value of the ENOB (ENOB_(T,RMS)) by assigning the RMSvalue of the SNR (SNR_(T,RMS)) to the equation 5. Additionally, theeffective bits measuring section 80 may calculate the peak-to-peak valueof the ENOB (ENOB_(T,PkPk)) by assigning the peak-to-peak value of theSNR (SNR_(T,PkPk)) to the equation 5. By performing the above-describedprocedure, the measuring apparatus 200 can accurately calculate thephase noise waveform to calculate the SNR and the ENOB.

In the procedure explained with reference to FIG. 21, the dataprocessing section 24 may perform the Fourier transform on the phasenoise waveform calculated in the step S324, so as to calculate the phasenoise spectrum. If this is the case, the SNR calculating section 26 andthe effective bits measuring section 80 may calculate the SNR and theENOB in the manner described with reference to FIGS. 2 to 14.

With the processing relating to the present example, the measuringapparatus 200 can detect an accurate phase noise waveform, in otherwords, aperture jitter waveform, of the AD converter 400. The measuringapparatus 200 can produce the following effects.

(a) Even when the analog input into the AD converter 400 has a lowfrequency, the measuring apparatus 200 can measure the RMS value of theENOB (ENOB_(T, RMS)) and the peak-to-peak value of the ENOB(ENOB_(T,PkPk)) without being masked by the quantization noise.

(b) The measuring apparatus 200 can perform the ENOB_(T,RMS) test andthe ENOB_(T,PkPk) test only by using a low-frequency signal generatorwhich is available at a low cost.

(c) The measuring apparatus 200 can obtain the aperture jitter waveformin the time domain. Accordingly, the measuring apparatus 200 candirectly obtain the RMS value (ENOB_(T,RMS)) and the peak-to-peak valueof the ENOB (ENOB_(T,PkPk)) from the RMS value σ_(Δφ) and thepeak-to-peak value d{Δφ} of the aperture jitter waveform, respectively.

(d) Based on the RMS value of the ENOB (ENOB_(T,RMS)), the measuringapparatus 200 can obtain the average value of the ENOB due to theaperture jitter. Also, based on the RMS value of the ENOB(ENOB_(T,PkPk)), the measuring apparatus 200 can obtain the worst-casevalue of the ENOB due to the instantaneous aperture jitter.

(e) When the AD converter 400 experiences malfunction, the measuringapparatus 200 can analyze the cause of the malfunction. According to thepresent example, the measurement results can be fed back to the designof the AD converter 400.

As mentioned above, the measuring apparatus 200 relating to the presentexample directly calculates the ENOB from the phase noise waveform inthe time domain, thereby being capable of measuring the peak-to-peakvalue of the ENOB (ENOB_(T,PkPk)). FIGS. 7 and 8 show the peak-to-peakvalue of the ENOB (ENOB_(T,PkPk)) which is measured by using the methoddescribed with reference to FIG. 21. When measured by using the methoddescribed with reference to FIG. 21, the RMS value of the ENOB is thesame as the ENOB_(T,RMS) shown in FIGS. 7 and 8.

As seen from FIGS. 7 and 8, the peak-to-peak value of the ENOBexperiences a loss of approximately two bits, when compared with the RMSvalue. Note that the RMS value of the ENOB provides the average value ofthe ENOB of the AD converter 400, and that the peak-to-peak value of theENOB provides the instantaneous ENOB of the AD converter 400. Here, theinstantaneous ENOB may indicate the ENOB of the AD converter 400 at eachmoment. The peak-to-peak value of the ENOB may indicate the worst-casevalue of the instantaneous ENOB.

FIG. 22 illustrates an exemplary configuration of a measuring apparatus100 relating to an embodiment of the present invention. The measuringapparatus 100 is designed for measuring the jitter of a clock signalunder measurement CLK. The measuring apparatus 100 includes therein thereference signal generating section 16, a signal measuring section 12,the buffer memory 22, the frequency domain transforming section 20, thespectrum compensating section 40, and a jitter measuring section 60. Thesignal generated by the reference signal generating section 16 may be aperiodic signal having a constant period, for example.

The signal measuring section 12 measures the input signal suppliedthereto from the reference signal generating section 16 with thesampling frequency provided by the clock signal under measurement CLK.The signal measuring section 12 may be, for example, an AD converterwhich detects the signal level of the input signal in accordance witheach rising edge of the clock signal under measurement CLK suppliedthereto, and outputs the digital data sequence formed by the detectedsignal levels, or the output code sequence, as the discrete waveform ofthe input signal.

The buffer memory 22, the frequency domain transforming section 20 andthe spectrum compensating section 40 may be the same as the buffermemory 22, the first frequency domain transforming section 20 and thespectrum compensating section 40 described with reference to FIGS. 1 and2. The jitter measuring section 60 measures the jitter of the clocksignal under measurement CLK based on the spectrum obtained as a resultof the compensation performed by the spectrum compensating section 40.The jitter measuring section 60 may perform the inverse Fouriertransform on the spectrum to generate the analytic signal, and measurethe jitter from the analytic signal.

The jitter measuring section 60 may include therein the phase noisewaveform calculating section 30 described with reference to FIG. 2. Thejitter measuring section 60 may calculate the timing jitter sequence ofthe clock signal under measurement CLK, which indicates the jitter ateach edge of the clock signal under measurement, by re-sampling thephase noise waveform generated by the phase noise waveform calculatingsection 30 in accordance with the timing of each edge of the clocksignal under measurement CLK. The jitter measuring section 60 may alsocalculate the RMS value, the peak-to-peak value and other values of thetiming jitter sequence. Also, the jitter measuring section 60 maycalculate the period jitter sequence of the clock signal undermeasurement by calculating the sequence of the differences each of whichis calculated based on two adjacent values in the timing jittersequence.

With the above-described configuration, the measuring apparatus 100 canmeasure the jitter of the clock signal under measurement CLK. When themeasuring apparatus 100 measures the jitter of the clock signal undermeasurement CLK, it is preferable that the jitter generated by thesignal measuring section 12 is as small as possible or known in advance.

FIG. 23 illustrates another exemplary configuration of the measuringapparatus 100. The measuring apparatus 100 relating to the presentexample is different from the measuring apparatus 100 shown in FIG. 22in that the single sideband spectrum generating section 34 is includedin place of the spectrum compensating section 40. Except for this, themeasuring apparatus 100 relating to the present example may be the sameas the measuring apparatus 100 shown in FIG. 22.

The single sideband spectrum generating section 34 may be the same asthe single sideband spectrum generating section 34 described withreference to FIG. 15. The jitter measuring section 60 may includetherein the phase noise waveform calculating section 30 described withreference to FIG. 15. Having the above configuration, the measuringapparatus 100 relating to the present example can calculate an accuratephase noise waveform. Therefore, the measuring apparatus 100 canaccurately measure the jitter of the clock signal under measurement CLK.Additionally, the single sideband spectrum generating section 34 maycompensate the non-symmetric sideband in the single sideband spectrum bycarrying on the procedure performed by the spectrum compensating section40 which is described with reference to the step S306 in FIG. 14, asmentioned earlier.

FIG. 24A illustrates the measurement results of the peak-to-peak valueof the instantaneous phase noise, or the measurement results of thepeak-to-peak value of the phase jitter. FIG. 24B illustrates themeasurement results of the RMS value of the jitter. In FIGS. 24A and24B, the measurement results obtained by using the measuring apparatus100 described with reference to FIG. 22 are indicated by circles, themeasurement results obtained by using the method described withreference to FIG. 28B are indicated by squares, and the measurementresults obtained by using the method described with reference to FIG. 29are indicated by triangles.

The fundamental frequency of the signal under measurement is set atthree different values of 51 MHz, 55 MHz and 71 MHz. When the methoddescribed with reference to FIG. 29 is used, the jitter values arecalculated based on the frequency components in the range of ±2 MHz withrespect to the fundamental frequency.

As seen from FIGS. 24A and 24B, the method described with reference toFIG. 28B can not measure the peak-to-peak value of the jitter, but themeasuring apparatus 100 can measure the peak-to-peak value of thejitter. Also, FIGS. 24A and 24B indicate that the jitter values measuredby using the measuring apparatus 100 are larger than the jitter valuesmeasured by using the method described with reference to FIG. 29. Thisis because the measuring apparatus 100 measures the jitter in a widerband than the method described with reference to FIG. 29. As is apparentfrom the above description, the measuring apparatus 100 can accuratelymeasure the jitter in a wide band, and measure the peak-to-peak value ofthe jitter.

FIG. 25 illustrates a further different exemplary configuration of themeasuring apparatus 100. According to the present example, the measuringapparatus 100 includes a window function multiplying section 14 inaddition to the constituents of the measuring apparatus 100 describedwith reference to FIG. 22 or 23. Except for the window functionmultiplying section 14, the measuring apparatus 100 relating the presentexample may be the same as the measuring apparatus 100 described withreference to FIG. 22 or 23. Here, the window function multiplyingsection 14 is provided as the following stage of the buffer memory 22.FIG. 25 illustrates the configuration which is achieved by adding thewindow function multiplying section 14 to the configuration of themeasuring apparatus 100 shown in FIG. 22, but the window functionmultiplying section 14 may be added to the configuration of themeasuring apparatus 100 illustrated in FIG. 23. Similarly, the windowfunction multiplying section 14 may be added to the measuring apparatus200 described with reference to FIGS. 1 to 21.

The window function multiplying section 14 may multiply the samplingresult obtained by the signal measuring section 12 by a predeterminedwindow function, and input the result of the multiplication into thefrequency domain transforming section 20. For example, the windowfunction multiplying section 14 may multiply the data sequence by awindow function whose value is substantially equal to zero at the bothends and is substantially equal to one at the middle. An example of sucha window function is Hanning window function. In this manner, even whenthe data sequence generated by the signal measuring section 12 does nothave a data length equal to an integral multiple of the period of thesignal under measurement, the measuring apparatus 100 can calculate thespectrum by performing the Fourier transform on the data sequence.

For example, even when the clock generating section 10 generates asampling clock which is not coherent with the period of the signal undermeasurement, the measuring apparatus 100 configured by using the windowfunction multiplying section 14 can accurately transform the samplingresult into the signal in the frequency domain.

The jitter measuring section 60 may include therein a correcting sectionthat corrects the instantaneous phase noise calculated by theinstantaneous phase noise calculating section 66. The instantaneousphase noise calculated by the instantaneous phase noise calculatingsection 66 contains an error attributable to the multiplication of thewindow function performed by the window function multiplying section 14.The correcting section corrects the instantaneous phase noise by usingthe window function multiplied by the window function multiplyingsection 14. For example, the correcting section may divide theinstantaneous phase noise in the time domain Δφ(t) which is calculatedby the instantaneous phase noise calculating section 66 by the windowfunction in the time domain w(t), and output the result of the divisionΔφ(t)/w(t) as the corrected instantaneous phase noise function.

FIG. 26A illustrates an exemplary configuration of a test apparatus 600relating to an embodiment of the present invention. The test apparatus600 is designed for testing a device under test 500 such as asemiconductor chip. The test apparatus 600 includes therein themeasuring apparatus 100 and a judging section 110. The measuringapparatus 100 measures the jitter of the signal under measurement outputfrom the device under test 500. The signal under measurement may be aclock signal. The measuring apparatus 100 may be the same as themeasuring apparatus 100 described with reference to FIGS. 22 to 25.

The measuring apparatus 100 may additionally include a signal inputsection that inputs a predetermined test signal into the device undertest 500 to cause the device under test 500 to output the signal undermeasurement. The judging section 110 judges whether the device undertest 500 is acceptable based on the jitter measured by the measuringapparatus 100. For example, the judging section 110 may judge whetherthe device under test 500 is acceptable based on whether the RMS value,the peak-to-peak value or the like of the jitter falls within apredetermined range.

FIG. 26B illustrates an exemplary configuration of a test apparatus 700relating to another embodiment of the present embodiment. The testapparatus 700 is designed to test the AD converter 400. The testapparatus 700 includes therein the measuring apparatus 200 and a judgingsection 210. The measuring apparatus 200 measures the jitter of thesignal output from the AD converter 400. The measuring apparatus 200 maybe the same as the measuring apparatus 200 described with reference toFIGS. 1 to 21.

The judging section 210 judges whether the AD converter 400 isacceptable based on the result of the measurement done by the measuringapparatus 200. For example, the judging section 210 may judge whetherthe AD converter 400 is acceptable based on whether the SNR of thediscrete waveform output from the AD converter 400, the ENOB of the ADconverter 400, the best-case values of the SNR and the ENOB, theworst-case values of the SNR and the ENOB, the RMS value of the phasenoise waveform, or the peak-to-peak value of the phase noise waveformfalls within the predetermined range.

FIG. 27 illustrates an exemplary configuration of a computer 1900. Thecomputer 1900 may control one of the measuring apparatuses 100 and 200and the test apparatuses 600 and 700 described with reference to FIGS. 1to 26B so as to function as described with reference to FIGS. 1 to 26B,in accordance with the programs supplied thereto. The computer 1900 mayfunction as at least some of the constituents of one of the measuringapparatuses 100 and 200 and the test apparatus 600 and 700.

The programs supplied to the computer 1900 may cause the computer 1900to control one of the measuring apparatuses 100 and 200 and the testapparatuses 600 and 700. Alternatively, the programs may cause thecomputer 1900 to function as at least some of the constituents of one ofthe measuring apparatuses 100 and 200 and the test apparatuses 600 and700.

The computer 1900 relating to the present embodiment is constituted by aCPU surrounding section, an input/output I/O section and a legacy I/Osection. The CPU surrounding section includes a CPU 2000, a RAM 2020, agraphic controller 2075 and a display device 2080 which are connected toeach other by means of a host controller 2082. The I/O section includesa communication interface 2030, a hard disk drive 2040, and a CD-ROMdrive 2060 which are connected to the host controller 2082 by means ofan I/O controller 2084. The legacy I/O section includes a ROM 2010, aflexible disk drive 2050, and an I/O chip 2070 which are connected tothe I/O controller 2084.

The host controller 2082 connects the RAM 2020 with the CPU 2000 andgraphic controller 2075 which access the RAM 2020 at a high transferrate. The CPU 2000 operates in accordance with programs stored on theROM 2010 and RAM 2020, to control the constituents. The graphiccontroller 2075 obtains image data which is generated by the CPU 2000 orthe like on a frame buffer provided within the RAM 2020, and causes thedisplay device 2080 to display the obtained image data. Alternatively,the graphic controller 2075 may include therein a frame buffer forstoring thereon the image data generated by the CPU 2000 or the like.

The I/O controller 2084 connects, to the host controller 2082, the harddisk drive 2040, communication interface 2030 and CD-ROM drive 2060which are I/O devices operating at a relatively high rate. Thecommunication interface 2030 communicates with external apparatuses viathe network. The hard disk drive 2040 stores thereon programs and datato be used by the CPU 2000 in the computer 1900. The CD-ROM drive 2060reads programs or data from a CD-ROM 2095, and supplies the readprograms or data to the hard disk drive 2040 via the RAM 2020.

The I/O controller 2084 is also connected to the ROM 2010, flexible diskdrive 2050 and I/O chip 2070 which are I/O devices operating at arelatively low rate. The ROM 2010 stores thereon a boot program executedby the computer 1900 at the startup, programs dependent on the hardwareof the computer 1900, and the like. The flexible disk drive 2050 readsprograms or data from a flexible disk 2090, and supplies the readprograms or data to the hard disk drive 2040 via the RAM 2020. The I/Ochip 2070 is connected to the flexible disk drive 2050, and used toconnect a variety of I/O devices to the computer 1900, via a parallelport, a serial port, a keyboard port, a mouse port or the like.

The programs to be provided to the hard disk drive 2040 via the RAM 2020are provided by a user in the state of being stored on a recordingmedium such as the flexible disk 2090, the CD-ROM 2095, and an IC card.The programs are read from the recording medium, and the read programsare installed in the hard disk drive 2040 in the computer 1900 via theRAM 2020, to be executed by the CPU 2000.

The programs are installed in the computer 1900. The programs mayrequest the CPU 2000 or the like to cause the computer 1900 to controlone of the measuring apparatuses 100 and 200 and the test apparatuses600 and 700. Alternatively, the programs may request the CPU 2000 or thelike to cause the computer 1900 to function as at least some of theconstituents of one of the measuring apparatuses 100 and 200 and thetest apparatuses 600 and 700.

The programs mentioned above may be stored on an external recordingmedium. Such a recording medium is, for example, an optical recordingmedium such as DVD and CD, a magnet-optical recording medium such as MO,a tape medium, a semiconductor memory such as an IC card and the like,in addition to the flexible disk 2090 and CD-ROM 2095. Alternatively,the recording medium may be a storage device such as a hard disk or RAMwhich is provided in a server system connected to a dedicatedcommunication network or the Internet, and the programs may be providedto the computer 1900 via the network.

The measuring apparatus 200 and the AD converter 400 described withreference to FIGS. 1 to 21 may be provided in the same electronicdevice. For example, the AD converter 400 may correspond to a circuitused for the actual operation of the electronic device, and themeasuring apparatus 200 may correspond to the self-diagnosis circuit forthe AD converter 400.

The buffer memory 22 may also be used during the actual operation of theelectronic device. The data processing section 24 may retrieve the dataindicating the discrete waveform from the buffer memory 22 when themeasuring apparatus 200 carries out the analysis of the AD converter400.

The data processing section 24 may process the data by using the digitalsignal processor (DSP) core, the microprocessing unit (MPU) core, thefast Fourier transform (FFT) core, and the like which are integratedinto the electronic device. The electronic device may be a transceiverchip used for wireless communication and other techniques.

Similarly, the measuring apparatus 100 and the signal measuring section12 described with reference to FIGS. 22 to 26B may be provided in thesame electronic device. For example, the signal measuring section 12 maycorrespond to the circuit used for the actual operation of theelectronic device, and the measuring apparatus 100 may correspond to theself-diagnosis circuit for the signal measuring section 12.

The buffer memory 22 may also be used during the actual operation of theelectronic device. The data processing section 24, which is constitutedby the window function multiplying section 14, the frequency domaintransforming section 20, the spectrum compensating section 40, thesingle sideband spectrum generating section 34, and the jitter measuringsection 60 as illustrated in FIGS. 22 to 26B, may retrieve the dataindicating the discrete waveform from the buffer memory 22 when themeasuring apparatus 100 carries out the diagnosis of the signalmeasuring section 12.

Although some aspects of the present invention have been described byway of exemplary embodiments, it should be understood that those skilledin the art might make many changes and substitutions without departingfrom the spirit and the scope of the present invention which is definedonly by the appended claims.

As clearly explained in the above description, the embodiments of thepresent invention can accurately measure the SNR of the discretewaveform output from the AD converter, and the ENOB of the AD converter.Also, the embodiments of the present invention can calculate thebest-case and worst-case values of the ENOB and the SNR in apredetermined band, by using the input signal having a single frequency.

Additionally, the embodiments of the present invention can accuratelymeasure the jitter in a wide band of the clock signal under measurement.Furthermore, the embodiments of the present invention can accuratelymeasure the RMS value, the peak-to-peak value or the like of the jitter.

1. A measuring apparatus for measuring a signal-to-noise ratio of adiscrete waveform which is output from an AD converter in response to aninput signal, the signal-to-noise ratio indicating a ratio of a signalcomponent of the input signal to noise generated by the AD converter,the measuring apparatus comprising: a spectrum compensating section thatreceives a spectrum of the discrete waveform output from the ADconverter, and compensates the received spectrum in accordance with anon-symmetric sideband between an upper sideband and a lower sideband ofthe received spectrum, the upper and lower sidebands being defined withrespect to a fundamental frequency of the input signal; and a phasenoise waveform calculating section that calculates a phase noisewaveform of the discrete waveform based on the spectrum which has beencompensated by the spectrum compensating section.
 2. The measuringapparatus as set forth in claim 1, further comprising an SNR calculatingsection that calculates the signal-to-noise ratio based on the phasenoise waveform.
 3. The measuring apparatus as set forth in claim 2,further comprising a second frequency domain transforming section thatconverts the phase noise waveform calculated by the phase noise waveformcalculating section into a phase noise spectrum in a frequency domain,wherein the SNR calculating section calculates the signal-to-noise ratiobased on the phase noise spectrum.
 4. The measuring apparatus as setforth in claim 3, wherein the SNR calculating section calculates thesignal-to-noise ratio based on a value obtained by adding togetherindividual frequency components in a predetermined band of the phasenoise spectrum.
 5. The measuring apparatus as set forth in claim 1,wherein the spectrum compensating section compensates the receivedspectrum by doubling frequency components in the non-symmetric sidebandin power equivalent.
 6. The measuring apparatus as set forth in claim 1,wherein the spectrum compensating section compensates the receivedspectrum by reducing, to half in power equivalent, frequency componentsin symmetric bands between the upper and lower sidebands, excludingfrequency components in the non-symmetric sideband.
 7. The measuringapparatus as set forth in claim 3, further comprising an effective bitsmeasuring section that calculates an effective number of bits of the ADconverter based on the signal-to-noise ratio.
 8. The measuring apparatusas set forth in claim 7, wherein based on a spectrum of a discretewaveform output from the AD converter in response to an input signalhaving a predetermined frequency, the effective bits measuring sectioncalculates at least one of a best-case value and a worst-case value ofthe effective number of bits which are observed when the input signalinput into the AD converter has a different frequency from thepredetermined frequency.
 9. The measuring apparatus as set forth inclaim 7, further comprising a reference signal generating section thatinputs into the AD converter an input signal whose frequency is lowerthan an Nyquist frequency of a sampling clock for the AD converter,wherein based on a spectrum of a discrete waveform output from the ADconverter in response to the input signal whose frequency is lower thanthe Nyquist frequency, the effective bits measuring section calculatesat least one of a best-case value and a worst-case value of theeffective number of bits which are observed when the input signal inputinto the AD converter has a frequency higher than the Nyquist frequency.10. The measuring apparatus as set forth in claim 1, wherein thespectrum compensating section eliminates harmonic components of afundamental component at the fundamental frequency of the input signal,from the received spectrum.
 11. The measuring apparatus as set forth inclaim 10, further comprising a first frequency domain transformingsection that transforms the discrete waveform output from the ADconverter into the spectrum having an observable band ranging from afrequency zero to a frequency corresponding to a sampling frequency ofthe AD converter, wherein the spectrum compensating section detects aharmonic component folded so as to be positioned within the observableband, based on the fundamental frequency of the input signal.
 12. Themeasuring apparatus as set forth in claim 1, wherein the phase noisewaveform calculating section includes: an analytic signal generatingsection that generates an analytic signal by transforming the spectrumwhich has been compensated by the spectrum compensating section into asignal in a time domain; an instantaneous phase calculating section thatcalculates an instantaneous phase of the input signal based on theanalytic signal; and an instantaneous phase noise calculating sectionthat calculates the phase noise waveform of the discrete waveform basedon the instantaneous phase of the input signal.
 13. A test apparatus fortesting an AD converter, comprising: a measuring apparatus that measuresone of (i) a signal-to-noise ratio of a discrete waveform which isoutput from the AD converter in response to an input signal and (ii) aneffective number of bits of the AD converter; and a judging section thatjudges whether the AD converter is acceptable based on a result of themeasurement by the measuring apparatus, wherein the measuring apparatusincludes: a spectrum compensating section that receives a spectrum ofthe discrete waveform output from the AD converter, and compensates thereceived spectrum in accordance with a non-symmetric sideband between anupper sideband and a lower sideband of the received spectrum, the upperand lower sidebands being defined with respect to a fundamentalfrequency of the input signal; and a phase noise waveform calculatingsection that calculates a phase noise waveform of the discrete waveformbased on the spectrum which has been compensated by the spectrumcompensating section.
 14. A recording medium storing thereon a programthat causes a computer to function as a measuring apparatus thatmeasures a signal-to-noise ratio of a discrete waveform which is outputfrom an AD converter in response to an input signal, the signal-to-noiseratio indicating a ratio of a signal component of the input signal tonoise generated by the AD converter, the program causing the computer tofunction as: a spectrum compensating section that receives a spectrum ofthe discrete waveform output from the AD converter, and compensates thereceived spectrum in accordance with a non-symmetric sideband between anupper sideband and a lower sideband of the received spectrum, the upperand lower sidebands being defined with respect to a fundamentalfrequency of the input signal; and a phase noise waveform calculatingsection that calculates a phase noise waveform of the discrete waveformbased on the spectrum which has been compensated by the spectrumcompensating section.
 15. A program causing a computer to function as ameasuring apparatus that measures a signal-to-noise ratio of a discretewaveform which is output from an AD converter in response to an inputsignal, the signal-to-noise ratio indicating a ratio of a signalcomponent of the input signal to noise generated by the AD converter,the program causing the computer to function as: a spectrum compensatingsection that receives a spectrum of the discrete waveform output fromthe AD converter, and compensates the received spectrum in accordancewith a non-symmetric sideband between an upper sideband and a lowersideband of the received spectrum, the upper and lower sidebands beingdefined with respect to a fundamental frequency of the input signal; anda phase noise waveform calculating section that calculates a phase noisewaveform of the discrete waveform based on the spectrum which has beencompensated by the spectrum compensating section.
 16. A measuringapparatus for measuring a signal-to-noise ratio of a discrete waveformwhich is output from an AD converter in response to an input signal, thesignal-to-noise ratio indicating a ratio of a signal component of theinput signal to noise generated by the AD converter, the measuringapparatus comprising: a single sideband spectrum generating section thatreceives a spectrum of the discrete waveform output from the ADconverter, and generates a single sideband spectrum whose sideband isone of an upper sideband and a lower sideband of the received spectrum,the upper sideband being higher in frequency than a fundamentalfrequency of the input signal, the lower sideband being lower infrequency than the fundamental frequency of the input signal; and aphase noise waveform calculating section that calculates a phase noisewaveform of the discrete waveform based on the single sideband spectrum.17. The measuring apparatus as set forth in claim 16, further comprisingan SNR calculating section that calculates the signal-to-noise ratiobased on the phase noise waveform.
 18. The measuring apparatus as setforth in claim 17, wherein the SNR calculating section calculates thesignal-to-noise ratio based on a time-domain value of the phase noisewaveform.
 19. The measuring apparatus as set forth in claim 18, whereinthe SNR calculating section calculates a peak-to-peak value of thesignal-to-noise ratio based on a time-domain peak-to-peak value of thephase noise waveform.
 20. The measuring apparatus as set forth in claim19, further comprising an effective bits measuring section thatcalculates an instantaneous effective number of bits of the AD converterbased on the peak-to-peak value of the signal-to-noise ratio.
 21. Themeasuring apparatus as set forth in claim 20, wherein based on aspectrum of a discrete waveform which is output from the AD converter inresponse to an input signal having a predetermined frequency, theeffective bits measuring section calculates the instantaneous effectivenumber of bits which is observed when the input signal input into the ADconverter has a different frequency than the predetermined frequency.22. The measuring apparatus as set forth in claim 21, further comprisinga reference signal generating section that inputs into the AD converteran input signal whose frequency is lower than an Nyquist frequency of asampling clock for the AD converter, wherein based on a spectrum of adiscrete waveform which is output from the AD converter in response tothe input signal whose frequency is lower than the Nyquist frequency,the effective bits measuring section calculates the instantaneouseffective number of bits observed when the input signal input into theAD converter has a frequency higher than the Nyquist frequency.
 23. Themeasuring apparatus as set forth in claim 18, wherein the SNRcalculating section calculates an RMS value of the signal-to-noise ratiobased on a time-domain RMS value of the phase noise waveform.
 24. Themeasuring apparatus as set forth in claim 23, further comprising aneffective bits measuring section that calculates an average effectivenumber of bits of the AD converter based on the RMS value of thesignal-to-noise ratio.
 25. The measuring apparatus as set forth in claim24, wherein based on a spectrum of a discrete waveform which is outputfrom the AD converter in response to an input signal having apredetermined frequency, the effective bits measuring section calculatesat least one of a best-case value and a worst-case value of the averageeffective number of bits which are observed when the input signal inputinto the AD converter has a different frequency than the predeterminedfrequency.
 26. The measuring apparatus as set forth in claim 24, furthercomprising a reference signal generating section that inputs into the ADconverter an input signal whose frequency is lower than an Nyquistfrequency of a sampling clock for the AD converter, wherein based on aspectrum of a discrete waveform output from the AD converter in responseto the input signal whose frequency is lower than the Nyquist frequency,the effective bits measuring section calculates at least one of abest-case value and a worst-case value of the average effective numberof bits which are observed when the input signal input into the ADconverter has a frequency higher than the Nyquist frequency.
 27. Themeasuring apparatus as set forth in claim 16, wherein the singlesideband spectrum generating section generates the single sidebandspectrum whose sideband is one of the upper and lower sidebands whichhas a larger bandwidth.
 28. The measuring apparatus as set forth inclaim 27, wherein when generating the single sideband spectrum whosesideband is the upper sideband, the single sideband spectrum generatingsection shifts a frequency component at the fundamental frequency of theinput signal and frequency components within the upper sideband whichare contained in the received spectrum of the discrete waveform, in sucha manner that the frequency component at the fundamental frequency ispositioned as a frequency component at dc and its single sidebandspectrum.
 29. The measuring apparatus as set forth in claim 27, whereinwhen generating the single sideband spectrum whose sideband is the lowersideband, the single sideband spectrum generating section reverses anorder of a frequency component at the fundamental frequency of the inputsignal and frequency components within the lower sideband which arecontained in the received spectrum of the discrete waveform, and shiftsthe frequency component at the fundamental frequency and the frequencycomponents within the lower sideband which are in the reversed order insuch a manner that the frequency component at the fundamental frequencyis positioned as a frequency component at dc and its single sidebandspectrum.
 30. The measuring apparatus as set forth in claim 16, whereinthe phase noise waveform calculating section calculates the phase noisewaveform by transforming the single sideband spectrum into a signal in atime domain.
 31. The measuring apparatus as set forth in claim 16,wherein the single sideband spectrum generating section generates thesingle sideband spectrum after having doubled in power equivalentindividual frequency components in the received spectrum.
 32. Themeasuring apparatus as set forth in claim 16, wherein the singlesideband spectrum generating section doubles in power equivalentindividual frequency components in the single sideband spectrum, andthen outputs the resulting single sideband spectrum.
 33. The measuringapparatus as set forth in claim 16, wherein the single sideband spectrumgenerating section eliminates harmonic components of a fundamentalcomponent at the fundamental frequency of the input signal, from thereceived spectrum.
 34. The measuring apparatus as set forth in claim 33,further comprising a first frequency domain transforming section thattransforms the discrete waveform output from the AD converter into thespectrum having an observable band ranging from a frequency zero to afrequency corresponding to a sampling frequency of the AD converter,wherein the single sideband spectrum generating section detects aharmonic component folded so as to be positioned within the observableband, based on the fundamental frequency of the input signal.
 35. Themeasuring apparatus as set forth in claim 16, wherein the phase noisewaveform calculating section includes: an analytic signal generatingsection that generates an analytic signal by transforming the singlesideband spectrum generated by the single sideband spectrum generatingsection into a signal in a time domain; an instantaneous phasecalculating section that calculates an instantaneous phase of the inputsignal based on the analytic signal; and an instantaneous phase noisecalculating section that calculates the phase noise waveform of thediscrete waveform based on the instantaneous phase of the input signal.36. The measuring apparatus as set forth in claim 17, further comprisinga second frequency domain transforming section that converts the phasenoise waveform calculated by the phase noise waveform calculatingsection into a phase noise spectrum in a frequency domain, wherein theSNR calculating section calculates the signal-to-noise ratio based onthe phase noise spectrum.
 37. A test apparatus for testing an ADconverter, comprising: a measuring apparatus that measures one of (i) asignal-to-noise ratio of a discrete waveform which is output from the ADconverter in response to an input signal and (ii) an effective number ofbits of the AD converter; and a judging section that judges whether theAD converter is acceptable based on a result of the measurement by themeasuring apparatus, wherein the measuring apparatus includes: a singlesideband spectrum generating section that receives a spectrum of thediscrete waveform output from the AD converter, and generates a singlesideband spectrum whose sideband is one of an upper sideband and a lowersideband of the received spectrum, the upper sideband being higher infrequency than a fundamental frequency of the input signal, the lowersideband being lower in frequency than the fundamental frequency of theinput signal; and a phase noise waveform calculating section thatcalculates a phase noise waveform of the discrete waveform based on thesingle sideband spectrum.
 38. A recording medium storing thereon aprogram that causes a computer to function as a measuring apparatus thatmeasures a signal-to-noise ratio of a discrete waveform which is outputfrom an AD converter in response to an input signal, the signal-to-noiseratio indicating a ratio of a signal component of the input signal tonoise generated by the AD converter, the program causing the computer tofunction as: a single sideband spectrum generating section that receivesa spectrum of the discrete waveform output from the AD converter, andgenerates a single sideband spectrum whose sideband is one of an uppersideband and a lower sideband of the received spectrum, the uppersideband being higher in frequency than a fundamental frequency of theinput signal, the lower sideband being lower in frequency than thefundamental frequency of the input signal; and a phase noise waveformcalculating section that calculates a phase noise waveform of thediscrete waveform based on the single sideband spectrum.
 39. A programcausing a computer to function as a measuring apparatus that measures asignal-to-noise ratio of a discrete waveform which is output from an ADconverter in response to an input signal, the signal-to-noise ratioindicating a ratio of a signal component of the input signal to noisegenerated by the AD converter, the program causing the computer tofunction as: a single sideband spectrum generating section that receivesa spectrum of the discrete waveform output from the AD converter, andgenerates a single sideband spectrum whose sideband is one of an uppersideband and a lower sideband of the received spectrum, the uppersideband being higher in frequency than a fundamental frequency of theinput signal, the lower sideband being lower in frequency than thefundamental frequency of the input signal; and a phase noise waveformcalculating section that calculates a phase noise waveform of thediscrete waveform based on the single sideband spectrum.
 40. A measuringapparatus for measuring jitter of a clock signal under measurement,comprising: a signal measuring section that measures a waveform of aninput signal with a predetermined sampling frequency; a frequency domaintransforming section that transforms the waveform measured by the signalmeasuring section into a spectrum of a predetermined frequency range; aspectrum compensating section that detects a non-symmetric sideband inthe predetermined frequency range between a sideband that is higher infrequency than a fundamental frequency of the input signal and asideband that is lower in frequency than the fundamental frequency ofthe input signal, and compensates the spectrum obtained by the frequencydomain transforming section in accordance with frequency components inthe detected non-symmetric sideband; and a jitter measuring section thatmeasures the jitter of the clock signal under measurement based on thespectrum which has been compensated by the spectrum compensatingsection.
 41. The measuring apparatus as set forth in claim 40, whereinthe jitter measuring section includes: an analytic signal generatingsection that generates an analytic signal by converting the spectrumwhich has been compensated by the spectrum compensating section into asignal in a time domain; an instantaneous phase calculating section thatcalculates an instantaneous phase of the waveform output from the signalmeasuring section based on the analytic signal; and an instantaneousphase noise calculating section that calculates an instantaneous phasenoise of the waveform output from the signal measuring section, based onthe instantaneous phase.
 42. A test apparatus for testing a device undertest, comprising: a measuring apparatus that measures jitter of a clocksignal under measurement output from the device under test; and ajudging section that judges whether the device under test is acceptablebased on the jitter measured by the measuring apparatus, wherein themeasuring apparatus includes: a signal measuring section that measures awaveform of an input signal with a predetermined sampling frequency; afrequency domain transforming section that transforms the waveformmeasured by the signal measuring section into a spectrum of apredetermined frequency range; a spectrum compensating section thatdetects a non-symmetric sideband in the predetermined frequency rangebetween a sideband that is higher in frequency than a fundamentalfrequency of the input signal and a sideband that is lower in frequencythan the fundamental frequency of the input signal, and compensates thespectrum obtained by the frequency domain transforming section inaccordance with frequency components in the detected non-symmetricsideband; and a jitter measuring section that measures the jitter of theclock signal under measurement based on the spectrum which has beencompensated by the spectrum compensating section.
 43. A recording mediumstoring thereon a program that causes a computer to function as a testapparatus for testing a device under test, the program causing thecomputer to function as: a measuring apparatus that measures jitter of aclock signal under measurement output from the device under test; and ajudging section that judges whether the device under test is acceptablebased on the jitter measured by the measuring apparatus, wherein theprogram causes the computer functioning as the measuring apparatus tofunction as: a signal measuring section that measures a waveform of aninput signal with a predetermined sampling frequency; a frequency domaintransforming section that converts the waveform measured by the signalmeasuring section into a spectrum of a predetermined frequency range; aspectrum compensating section that detects a non-symmetric sideband inthe predetermined frequency range between a sideband that is higher infrequency than a fundamental frequency of the input signal and asideband that is lower in frequency than the fundamental frequency ofthe input signal, and compensates the spectrum obtained by the frequencydomain transforming section in accordance with frequency components inthe detected non-symmetric sideband; and a jitter measuring section thatmeasures the jitter of the clock signal under measurement based on thespectrum which has been compensated by the spectrum compensatingsection.
 44. A program causing a computer to function as a testapparatus for testing a device under test, the program causing thecomputer to function as: a measuring apparatus that measures jitter of aclock signal under measurement output from the device under test; and ajudging section that judges whether the device under test is acceptablebased on the jitter measured by the measuring apparatus, wherein theprogram causes the computer functioning as the measuring apparatus tofunction as: a signal measuring section that measures a waveform of aninput signal with a predetermined sampling frequency; a frequency domaintransforming section that converts the waveform measured by the signalmeasuring section into a spectrum of a predetermined frequency range; aspectrum compensating section that detects a non-symmetric sideband inthe predetermined frequency range between a sideband that is higher infrequency than a fundamental frequency of the input signal and asideband that is lower in frequency than the fundamental frequency ofthe input signal, and compensates the spectrum obtained by the frequencydomain transforming section in accordance with frequency components inthe detected non-symmetric sideband; and a jitter measuring section thatmeasures the jitter of the clock signal under measurement based on thespectrum which has been compensated by the spectrum compensatingsection.
 45. A measuring apparatus for measuring jitter of a clocksignal under measurement, comprising: a signal measuring section thatmeasures a waveform of an input signal with a predetermined samplingfrequency; a frequency domain transforming section that transforms thewaveform measured by the signal measuring section into a spectrum of apredetermined frequency range; a single sideband spectrum generatingsection that receives the spectrum of the waveform output from thesignal measuring section, and generates a single sideband spectrum whosesideband is one of an upper sideband and a lower sideband of thereceived spectrum, the upper sideband being higher in frequency than afundamental frequency of the input signal, the lower sideband beinglower in frequency than the fundamental frequency of the input signal;and a jitter measuring section that measures the jitter of the clocksignal under measurement based on the single sideband spectrum generatedby the single sideband spectrum generating section.
 46. The measuringapparatus as set forth in claim 45, wherein the jitter measuring sectionincludes: an analytic signal generating section that generates ananalytic signal by converting the single sideband spectrum generated bythe single sideband spectrum generating section into a signal in a timedomain; an instantaneous phase calculating section that calculates aninstantaneous phase of the waveform output from the signal measuringsection, based on the analytic signal; and an instantaneous phase noisecalculating section that calculates an instantaneous phase noise of thewaveform output from the signal measuring section, based on theinstantaneous phase.
 47. A test apparatus for testing a device undertest, comprising: a measuring apparatus that measures jitter of a clocksignal under measurement output from the device under test; and ajudging section that judges whether the device under test is acceptablebased on the jitter measured by the measuring apparatus, wherein themeasuring apparatus includes: a signal measuring section that measures awaveform of an input signal with a predetermined sampling frequency; afrequency domain transforming section that transforms the waveformmeasured by the signal measuring section into a spectrum of apredetermined frequency range; a single sideband spectrum generatingsection that receives the spectrum of the waveform output from thesignal measuring section, and generates a single sideband spectrum whosesideband is one of an upper sideband and a lower sideband of thereceived spectrum, the upper sideband being higher in frequency than afundamental frequency of the input signal, the lower sideband beinglower in frequency than the fundamental frequency of the input signal;and a jitter measuring section that measures the jitter of the clocksignal under measurement based on the single sideband spectrum generatedby the single sideband spectrum generating section.
 48. A recordingmedium storing thereon a program that causes a computer to function as atest apparatus for testing a device under test, the program causing thecomputer to function as: a measuring apparatus that measures jitter of aclock signal under measurement output from the device under test; and ajudging section that judges whether the device under test is acceptablebased on the jitter measured by the measuring apparatus, wherein theprogram causing the computer functioning as the measuring apparatus tofunction as: a signal measuring section that measures a waveform of aninput signal with a predetermined sampling frequency; a frequency domaintransforming section that transforms the waveform measured by the signalmeasuring section into a spectrum of a predetermined frequency range; asingle sideband spectrum generating section that receives the spectrumof the waveform output from the signal measuring section, and generatesa single sideband spectrum whose sideband is one of an upper sidebandand a lower sideband of the received spectrum, the upper sideband beinghigher in frequency than a fundamental frequency of the input signal,the lower sideband being lower in frequency than the fundamentalfrequency of the input signal; and a jitter measuring section thatmeasures the jitter of the clock signal under measurement based on thesingle sideband spectrum generated by the single sideband spectrumgenerating section.
 49. A program causing a computer to function as atest apparatus for testing a device under test, the program causing thecomputer to function as: a measuring apparatus that measures jitter of aclock signal under measurement output from the device under test; and ajudging section that judges whether the device under test is acceptablebased on the jitter measured by the measuring apparatus, wherein theprogram causing the computer functioning as the measuring apparatus tofunction as: a signal measuring section that measures a waveform of aninput signal with a predetermined sampling frequency; a frequency domaintransforming section that transforms the waveform measured by the signalmeasuring section into a spectrum of a predetermined frequency range; asingle sideband spectrum generating section that receives the spectrumof the waveform output from the signal measuring section, and generatesa single sideband spectrum whose sideband is one of an upper sidebandand a lower sideband of the received spectrum, the upper sideband beinghigher in frequency than a fundamental frequency of the input signal,the lower sideband being lower in frequency than the fundamentalfrequency of the input signal; and a jitter measuring section thatmeasures the jitter of the clock signal under measurement based on thesingle sideband spectrum generated by the single sideband spectrumgenerating section.
 50. An electronic device that includes therein an ADconverter and a data processing section that measures noise generated bythe AD converter, wherein the data processing section includes: aspectrum compensating section that receives a spectrum of a discretewaveform which is output from the AD converter in response to an inputsignal, and compensates the received spectrum in accordance with anon-symmetric sideband between an upper sideband and a lower sideband ofthe received spectrum, the upper and lower sidebands being defined withrespect to a fundamental frequency of the input signal; and a phasenoise waveform calculating section that calculates a phase noisewaveform of the discrete waveform based on the spectrum which has beencompensated by the spectrum compensating section.
 51. The electronicdevice as set forth in claim 50, wherein the data processing sectionretrieves data indicating the discrete waveform, when diagnosing the ADconverter.
 52. The electronic device as set forth in claim 50, furthercomprising a buffer that stores thereon data indicating the discretewaveform output from the AD converter, wherein the data processingsection retrieves the data indicating the discrete waveform from thebuffer, when diagnosing the AD converter.
 53. An electronic device thatincludes therein an AD converter and a data processing section thatmeasures noise generated by the AD converter, wherein the dataprocessing section includes: a single sideband spectrum generatingsection that receives a spectrum of a discrete waveform which is outputfrom the AD converter in response to an input signal, and generates asingle sideband spectrum whose sideband is one of an upper sideband anda lower sideband of the received spectrum, the upper sideband beinghigher in frequency than a fundamental frequency of the input signal,the lower sideband being lower in frequency than the fundamentalfrequency of the input signal; and a phase noise waveform calculatingsection that calculates a phase noise waveform of the discrete waveformbased on the single sideband spectrum.